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OEMs: AG Associates
Branson/IPC
Brooks Equipe PRI
CHA
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Electroglas
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Hitachi
KLA-Tencor
Lam Research
Matrix
MRC
NanoMaster
Oxford
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PlasmaTherm
Premtek
STS SPTS
Tegal
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TES
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SemiStar Corp. Semiconductor Equipment Parts Service

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Metrology Probe Tester

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ElectroGlas Probe Teradyne Tester

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Test and measurement Equipment

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Micromanipulator P300A

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MMR Technologies Hall effect

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KLA-Tencor P 10 Profiler

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KLA Tencor P 17 Profiler

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8″ KLA / TENCOR ECD-2

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KLA-Tencor Surfscan 6420

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SDI 210, 210E-SPV Measurement

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Veeco Optical Profiler

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Nanometrics NanoSpec 8300X

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Jeol JWS-7700 Wafer Inspection

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We have recently acquired the following equipment from a 4-inch GaAs Fab in the USA: 8 sets of Lam AutoEtch 490 plasma etchers; 5 sets of Matrix 105 plasma asher/descum systems; 4 sets of AG Heatpulse RTP systems (models 4100 and 8108).

Main New Equipment & Parts Service

Vacuum Rapid Thermal Processors
Furnace :Atmosphere CVD/ PLCVD
Plasma Asher / Descum
Plasma Etch /RIE/ ICP/ DRIE/ PEALE
- Ion Beam Milling
Atomic Layer Deposition -ALD/PEALD
- Hybrid Systems
PECVD / Microwave PECVD
MOCVD, PA-MOCVD
Sputtering Deposition
E-Beam & Thermal Evaporator
Optical Coating System
Wet & Dry Cleaning, Reticle/Mask Cleaning
Space Simulation & Metrology Instruments
Accessories, Spare Parts & Service

Main Refurbished Equipment and Accessories

Rapid Thermal Processors
Plasma Asher /Descum
Plasma Etchers
Plasma Etch/ RIE/ ICP/ DRIE
ALD PECVD CVD
Sputtering Deposition
E-Beam & Thermal Evaporator
Metrology Instruments
Wafer Probes
SEM FEG
Tester
Mask Aligner
Robot Controller Aligner Accessories
Vacuum Pumps /Compressor Accessories
Chillers Accessories

Main Rapid Thermal Processors

Rapid Thermal Processors

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers

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Navigation

ElectroGlas Probe Teradyne Tester

Test and measurement Equipment

Micromanipulator P300A

MMR Technologies Hall effect

KLA-Tencor P 10 Profiler

KLA Tencor P 17 Profiler

8″ KLA / TENCOR ECD-2

KLA-Tencor Surfscan 6420

SDI 210, 210E-SPV Measurement

Veeco Optical Profiler

Nanometrics NanoSpec 8300X

Jeol JWS-7700 Wafer Inspection