Description
Typical NANOTECHNOLOGY Lab Fab Equipment
Please contact us for our Main Refurbished Equipment. Appreciate your time.
The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.
| 1 | 4Wave IBD/BTD Cluster Sputter Deposition System |
| 2 | 4Wave IBE-20B Ion Milling System |
| 3 | ABM Mask Contact Aligner |
| 4 | AccuSputter AW4450 Sputtering Deposition Equipment |
| 5 | AccuThermo AW610M Rapid Thermal Processing Equipment |
| 6 | AccuThermo AW820M Rapid Thermal Processing Equipment |
| 7 | ADT 7132 Dicing Saw |
| 8 | Air Control Inc. Microvoid 4F-55 Fume Hood |
| 9 | Airco FC-1800 |
| 10 | Allied High Tech Dual Prep PH-3 Grinding and Polishing System |
| 11 | AllWin21 Downstream Asher |
| 12 | Aluminum Oxide EUV Photodetector Transfer Standard |
| 13 | Analytical Electron Microscope |
| 14 | AnnealSys AS-One |
| 15 | AnnealSys RTA |
| 16 | Anton Paar DMA 5000 Density Meter |
| 17 | Anton Paar SAXess X Ray Device |
| 18 | Aperture area measurement facility |
| 19 | Apparatus for the Measurement of High Temperature Thermoelectric Transport Properties |
| 20 | AR200 Refractometer meter |
| 21 | ASML PAS5500/275D Stepper |
| 22 | AST Barrel Asher |
| 23 | Asylum Jupiter XR Atomic Force Microscope |
| 24 | ATI Orion Model 130 Conductivity Meter |
| 25 | Atom Probe Tomography (LEAP 4000X Si/HR – Local Electrode Atom Probe) |
| 26 | Atomic Layer Deposition |
| 27 | Avanti Custom Mini Extruder |
| 28 | AW-105R Plasma Asher Plasma Descum |
| 29 | AW-901eR Plasma Etcher |
| 30 | AW-903eR Plasma Etcher |
| 31 | AW-B3000 Plasma Asher Plasma Descum |
| 32 | AWgage-150 Thin Film Metrology, 6 inch |
| 33 | Bachur & Associates LS-200FSX Photoresist Stabilization System |
| 34 | Baker Biochem GARD Biosafety Cabinet |
| 35 | Barnstead Lab-Line 3608-5 Oven |
| 36 | Barnstead MicroPure UV Water Purification System |
| 37 | Barnstead/Thermolyne M48725 Platform Mixer/Rocker/Shaker |
| 38 | Barska Digital Microscope |
| 39 | Bauschlomb Stereo 7 Microscope |
| 40 | Beamline 1: Degradation of EUV filters and mirrors |
| 41 | Beamline 10: Quantitative Hyperspectral Infrared Microscopy |
| 42 | Beamline 2: Absolute Source-Based Radiometry |
| 43 | Beamline 3: Extended Range Monochromator for Ultraviolet and Extreme-Ultraviolet Optical Properties and Calibrations |
| 44 | Beamline 4: Ultraviolet Optical Properties and Calibrations |
| 45 | Beamline 5: New electron beam imaging system |
| 46 | Beamline 7: EUV reflectometry |
| 47 | Beamline 8: Surface chemistry & durability of EUV optics |
| 48 | Bel-Art Secador 2.0 Desiccator Cabinet |
| 49 | Benchmark Hotplate stirrer |
| 50 | Benchmark Scientific Orbi-Shaker Jr. Orbital Shaker |
| 51 | Benchmark Scientific Roto-Therm Plus H2024 Incubated Tube Rotator with Adjustable Speed |
| 52 | Bibby Scientific Stuart SRT1/SRT6 Roller-Mixer |
| 53 | Bidirectional optical scattering facility |
| 54 | Bilayer Overtone Analysis Instrument (BOA) |
| 55 | Binder VDL023 Volatiles Vacuum oven |
| 56 | BMDO transfer radiometer (BXR) |
| 57 | Branson 1510 Ultrasonic Cleaner |
| 58 | Branson 2510-DTH Ultrasonic Cleaner |
| 59 | Branson 2800-MH Ultrasonic Cleaner |
| 60 | Branson 3510-DTH Ultrasonic Cleaner |
| 61 | Branson 3800-CPX Ultrasonic Cleaner |
| 62 | Branson/IPC 3000 |
| 63 | Branson/IPC L3200 |
| 64 | Bruker Dektak 6M contact profilometer |
| 65 | Bruker Dektak XT Profilometer |
| 66 | Bruker Dimension FastScan Atomic Force Microscope |
| 67 | Buchi TO-51 Drying Tube |
| 68 | Buehler Electromet 4 Polisher/Etcher |
| 69 | Buehler Isomet Low-Speed Saw |
| 70 | Building Integrated Photovoltaic Testbed |
| 71 | Cabinet x-ray system |
| 72 | Calibrations: Gamma-ray Spectrometry System |
| 73 | Carbolite RHF 16-8 Chamber Furnace |
| 74 | Carbolite STF 16-180 Single-Zone Tube Furnace |
| 75 | Carbolite TZF 12/65/550 Three-Zone Tube Furnace |
| 76 | Carver Mini-C Laboratory Press |
| 77 | Carver Model C Laboratory Press |
| 78 | Cascade PS-21 |
| 79 | CEE Apogee Spinner |
| 80 | Center for High Accuracy Retroreflection Measurements (CHARM) |
| 81 | CHA Evaporator |
| 82 | CHA Mark 50 |
| 83 | Cleatech Type II Desiccator Cabinet |
| 84 | Cold Neutron Imaging Instrument |
| 85 | Color and appearance metrology facility |
| 86 | Complete hemispherical infrared laser-based reflectometer (CHILR) |
| 87 | Cone Calorimeter |
| 88 | Continuous-wave terahertz spectrometer |
| 89 | Corning PC-420 Stirrer Hot-Plate |
| 90 | Corning PC-420D Stirring Hotplate |
| 91 | Coy Laboratory Products Basic Glove Box |
| 92 | CPA S-Gun -Sputter |
| 93 | Daigger Genie 2 Vortex Mixer |
| 94 | Denton Vacuum Discovery 550 Sputtering System B104 Left |
| 95 | Denton Vacuum Discovery 550 Sputtering System B104 Right |
| 96 | Denton Vacuum Infinity 22 Electron Beam and Thermal Evaporator |
| 97 | Denton Vacuum Infinity 22 Electron Beam Evaporator |
| 98 | Dew-point measurements for water in compressed gases |
| 99 | Dickson TH550 Humidity Metrology |
| 100 | Differential Scanning Calorimeter |
| 101 | Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM) |
| 102 | Dynamic Humidity Measurements with the Hybrid Humidity Generator |
| 103 | DynaPro NanoStar Dynamic Light Scattering |
| 104 | E-Beam Evaporation CHA |
| 105 | E-Beam Evaporation Plasys |
| 106 | E-Beam Evaporation Sharon |
| 107 | E-Beam Evaporation Temescal |
| 108 | Ecopia Hall Effect Measurement System |
| 109 | Electroglas EG 1034 |
| 110 | Electroglas EG 2001 |
| 111 | Electroglas EG 4090u+ |
| 112 | Electroglas EG 4090X |
| 113 | Emscope SC-650 |
| 114 | Envirco Laminar Hood |
| 115 | Eppendorf 5415C Centrifuge |
| 116 | Eppendorf 5415R Centrifuge |
| 117 | Eppendorf 5702 Centrifuge |
| 118 | Eppendorf 5810R Centrifuge |
| 119 | F.E.I.Quanta 200 |
| 120 | Facility for spectroradiometric calibrations (FASCAL 2) |
| 121 | Facility for spectroradiometric calibrations (FASCAL) |
| 122 | Far-infrared Spectrometer |
| 123 | FEI Helios NanoLab 660 Dual Beam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB) – FIB1 |
| 124 | FEI Helios NanoLab 660 Dual Beam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB) 2 |
| 125 | FEI Titan 80-300 Analytical Transmission Electron Microscope |
| 126 | Filmetrics F40-UV Reflectometer |
| 127 | Filmetrics F50 UV Mapping Reflectometer |
| 128 | Fire Calorimetry Database (FCD) |
| 129 | Fire Emulator/Detector Evaluator |
| 130 | First Ten Angstroms FTA125 Contact Angle Goniometer |
| 131 | Fischione Model 1040 NanoMill Ion Mill |
| 132 | Fisher Isotemp Junior Model 201 Oven |
| 133 | Fisher Scientific Benchtop pH/mV/C Meter |
| 134 | Fisher Scientific Education pH Meter |
| 135 | Fisher Scientific Isotemp 650 Series Model 58 Muffle Furnace |
| 136 | Fisher Scientific Isotemp Oven |
| 137 | Fisher Scientific Uri-Spin Model 430 Centrifuge |
| 138 | Fisherbrand Model 50 Sonic Dismembrator |
| 139 | Five-axis goniometer for BRDF measurements |
| 140 | Focused beam spectroscopic ellipsometer |
| 141 | Focused Ion Beam |
| 142 | Focused Ion Beam Scanning Electron Microscope (Helios 660) |
| 143 | Four Dimensions 280DI Sheet Resistance Mapping System |
| 144 | Fourier transform infrared spectrophotometry (FTIS) facility |
| 145 | Fourier Transform Infrared Spectroscopy |
| 146 | Gaertner L117 |
| 147 | Gas Flow Standard for Calibrating and Modeling Meters Used to Measure Semiconductor Process Gases – SlowFlowS |
| 148 | Gas Flow Standards |
| 149 | Gasonics Aura 1000 |
| 150 | Gasonics Aura 2000 |
| 151 | Gasonics Aura 3000 |
| 152 | Gasonics Aura 3010 |
| 153 | Gasonics L3510 |
| 154 | Gemstar Atomic Layer Deposition |
| 155 | Gerald GR-47 Refrigerator |
| 156 | GnP 412S, Post-CMP Wafer Cleaner |
| 157 | Goniophotometer for specular gloss calibrations – Glossmeter |
| 158 | Gravimetric Standard for Liquid Micro-Flow |
| 159 | Hanna 5221 pH Meter |
| 160 | Hard X-ray Photoelectron Spectroscopy (HAXPES) |
| 161 | Harrick Plasma PDC-32 Plasma Bonder |
| 162 | Heatpulse 210 |
| 163 | Heatpulse 310 |
| 164 | Heatpulse 410 |
| 165 | Heatpulse 4100 |
| 166 | Heatpulse 4100S |
| 167 | Heatpulse 4108 |
| 168 | Heatpulse 610 |
| 169 | Heatpulse 610I |
| 170 | Heatpulse 8108 |
| 171 | Heatpulse 8800 |
| 172 | Heidelberg Instruments DWL 2000 Laser Pattern Generator |
| 173 | Heidelberg MLA150 Maskless Aligner |
| 174 | Herzan AVI-400 Vibration Isolation Table |
| 175 | HEWLETT PACKARD,Agilent HP 4062UX |
| 176 | Hiden Analytical DSMS Mass Spectometer |
| 177 | High Flux Backscattering Spectrometer (HFBS) |
| 178 | High Throughput (Combinatorial) Screening Tool for Characterization of Thin Film Thermoelectrics as a Function Temperature |
| 179 | HITACHI S-4700 |
| 180 | Horiba Twin Model B-173 Conductivity Meter |
| 181 | HP-BioSANS (LIPSS) |
| 182 | HVAC&R Equipment Environmental Chambers |
| 183 | Hydro DI Water Filtration System |
| 184 | Hysitron PI-85 Picoindentor |
| 185 | IEC Clinical Centrifuge |
| 186 | IKA RV10 Rotary Evaporator with HB10 Bath |
| 187 | Indoor Air Quality Test House |
| 188 | Infrared reference integrating sphere (IRIS) |
| 189 | Innovative Technology Pure Lab Glove Box |
| 190 | Instrumental Neutron Activation Analysis (INAA) |
| 191 | Integrating Sphere-based Weathering Device |
| 192 | IPEC 472, Chemical Mechanical Polisher (CMP) |
| 193 | Ismatec MCP-Z Gear Pump |
| 194 | J. A. Woollam M-2000 DI Spectroscopic Ellipsometer |
| 195 | Jeio Tech OF-12G Forced Convection Oven |
| 196 | Jeio Tech ON-02G Drying Oven |
| 197 | Jelight 42 UVO Cleaner |
| 198 | JEOL JBX 6300-FS Direct Write Electron Beam Lithography System |
| 199 | JEOL JBX 6300-FS Direct Write Electron Beam Lithography System (Cleanroom) |
| 200 | JETFIRST 100 -RTP |
| 201 | JETFIRST 150 -RTP |
| 202 | JETFIRST 200 RTP |
| 203 | Jipelec Jetfirst 200 |
| 204 | Keithley 4200 SCS Parametric Test Station |
| 205 | KLA Tencor P6 |
| 206 | KLA Tencor P-7 |
| 207 | KSV Langmuir-Blodgett Minitrough |
| 208 | Kulicke and Soffa Model 4526 Wedge Wire Bonder |
| 209 | Labconco Dishwasher |
| 210 | Labconco FreezeZone Benchtop Freeze Dry System |
| 211 | Labconco Precise HEPA-Filtered Glovebox |
| 212 | Labcondo RapidVap Vacuum, N2 & N2/48 Evaporation Systems |
| 213 | Labnet Digital Dry Bath |
| 214 | LabRep Co. Freezer |
| 215 | LabRep Co. Refrigerator 4°C |
| 216 | Lam AutoEtch 490 |
| 217 | Lam AutoEtch 590 |
| 218 | Lam Rainbow 4420 |
| 219 | Large Aperture Scanner |
| 220 | Large Area Rapid Imaging Analytical Tool (LARIAT I) |
| 221 | Large Area Rapid Imaging Analytical Tool (LARIAT II) |
| 222 | Laser Doppler Vibrometer Microscope |
| 223 | Lateral Ignition and Flame Spread Apparatus |
| 224 | Lattice Gear LatticeAx Cleaving Tool |
| 225 | Lauda Ecoline E100 Immersion Thermostat |
| 226 | Laurell HL Series Spin Coater |
| 227 | Leak Artifacts |
| 228 | Leica DM LM Microscope |
| 229 | Leica EM GP Automatic Plunge Freezer |
| 230 | Leica/Cambridge Instruments Galen III Microscope |
| 231 | Leico Heat Lamp |
| 232 | Line Heat-Source Guarded Hot Plate |
| 233 | Liquid Density |
| 234 | Liquid Flow Standards |
| 235 | Little Red Magnet (LRM) |
| 236 | Local Electrode Atom Probe Tomography (LEAP) |
| 237 | Low background infrared (LBIR) facility |
| 238 | Low Pressure Gauges |
| 239 | Lunar spectro-radiometer |
| 240 | Manufacturing Robotics Testbed |
| 241 | March PX-250 |
| 242 | Material Analysis Using Neutron Depth Profiling |
| 243 | Matrix 105 |
| 244 | Matrix 205 |
| 245 | Matrix 209S |
| 246 | Matrix 303 |
| 247 | Matrix 403 |
| 248 | MBRAUN LabMaster 130 Glovebox |
| 249 | Mercury Probe |
| 250 | Metal Additive Manufacturing (AM) Research Facility |
| 251 | Mettler Toledo ML6002T |
| 252 | Mettler Toledo SevenCompact S220 pH/Ion Meter |
| 253 | Mettler Toledo SevenEasy S20 pH Meter |
| 254 | Mettler Toledo XP26 22g Micro Balance |
| 255 | Microcalorimeter Detector |
| 256 | Micro-Combined Heat and Power Device Test Facility |
| 257 | Microfluidic Test Station |
| 258 | Microprocess Technology Avenger Spray Solvent Lift-off Tool |
| 259 | Microscope AFX-II |
| 260 | Microwave Asher |
| 261 | Milipore Stirred Ultrafiltration Cell |
| 262 | Milli-Q IQ 7000 Water Purification system |
| 263 | Minimum-Deviation-Angle Refractometry System |
| 264 | Missile defense transfer radiometer (MDXR) |
| 265 | Mobile Solar Tracker Facility |
| 266 | Molecular Beam Epitaxy (MBE) Facility |
| 267 | MPT RTP-3000 |
| 268 | MRC 603 693 TES |
| 269 | MRC 603 Sputter |
| 270 | MRC 643 -Sputter |
| 271 | MRC 8671 Sputtering |
| 272 | MTI GB1 Compact Glove Box |
| 273 | MTI GSL1100X Tube Furnace |
| 274 | MyFuge Mini Centrifuge |
| 275 | Nanocalorimeter Calibration System |
| 276 | Nanocalorimeter Measurement System |
| 277 | NanoDrop One/OneC Microvolume UV-Vis Spectrophotometer |
| 278 | NanoFab Tool: Xactix Xetch Xenon Difluoride Silicon Etcher |
| 279 | Nanonex NX-2000 Nanoimprint Lithography (NIL) System |
| 280 | Near Edge X-ray Absorption Fine Structure (NEXAFS) |
| 281 | Netzsch STA 449 F1 Jupiter Simultaneous Thermal Analyzer |
| 282 | Neutron Imaging Facility (NIF) |
| 283 | Neutron Interferometry and Optics Facilities |
| 284 | New Brunswick Innova 4200 Incubator-Shaker |
| 285 | NewAir Al-500S Under Counter Ice Machine |
| 286 | Nexus 670 ThermoNicolet Fourier Transform Infrared Spectrometer |
| 287 | Nikon Eclipse E600POL Microscope |
| 288 | Nikon L200 Compound Optical Microscope |
| 289 | Nikon SMZ1500 Stereo Microscope |
| 290 | NIMA LB 2011 Langmuir Trough With Linear Dipper |
| 291 | NIST Gonio-spectroradiometer |
| 292 | Nonlinear Optical Spectroscopy |
| 293 | Normal incidence Diffuse Optical Scatter Instrument (NDOSI) |
| 294 | Ohaus AS200 Balance |
| 295 | Ohaus Explorer E02140 Balance |
| 296 | Ohaus GA 200 Balance |
| 297 | Ohaus GT 410 Balance |
| 298 | Olympus SZH10 Stereo Microscope |
| 299 | OXFORD 100 RIE |
| 300 | Oxford 133 RIE |
| 301 | Oxford Benchmate Autoclavable Pipettes |
| 302 | Oxford Plasmalab 100 Inductively Coupled Plasma (ICP) Metal Etcher |
| 303 | Oxford Plasmalab 100 Inductively Coupled Plasma (ICP) Silicon Etcher |
| 304 | Oxford Plasmalab 100 Plasma Enhanced Chemical Vapor Deposition |
| 305 | Oxford PlasmaPro 100 Inductively Coupled Plasma (ICP) Dielectric Etcher |
| 306 | Oxford PlasmaPro 100 Inductively Coupled Plasma (ICP) III-V Etcher |
| 307 | Ozone Standard Reference Photometer |
| 308 | PDMS Casting Station |
| 309 | PECVD PlasmaTherm 790 |
| 310 | Perkin-Elmer 2400 |
| 311 | Perkin-Elmer 4400 |
| 312 | Perkin-Elmer 4450 |
| 313 | Photovoltaic Characterization Laboratory |
| 314 | Piston gauges and pressure transducers |
| 315 | Planetary Fritsch Pulverisette 7 Micro Mill |
| 316 | Plasma Etch BT1 |
| 317 | PlasmaEtch PE-100 |
| 318 | PlasmaLab 80 Plus |
| 319 | Plasmalab 80+ DPCVD |
| 320 | PlasmaTherm 700 |
| 321 | PlasmaTherm 700 |
| 322 | PlasmaTherm 720 |
| 323 | PlasmaTherm 720 |
| 324 | PlasmaTherm 790 |
| 325 | PlasmaTherm 790 RIE |
| 326 | Plasma-Therm Versaline High Density Plasma Enhanced Chemical Vapor Deposition (HD-PECVD) |
| 327 | Polarized Resonant Soft X-ray Scattering (P-RSoXS) |
| 328 | Positron Annihilation Lifetime Spectrometer |
| 329 | Precision Imaging Facility |
| 330 | Precision Scientific 19 Vacuum Oven |
| 331 | Primary optical watt radiometer (POWR) facility |
| 332 | Prompt Gamma-Ray Activation Analysis (PGAA) |
| 333 | Public Safety Communication Innovation Laboratory |
| 334 | Radiance temperature calibration laboratory |
| 335 | Radiative Gasification Apparatus |
| 336 | Radiochemical Neutron Activation Analysis (RNAA) |
| 337 | Radiopharmaceutical Standardization Laboratory |
| 338 | RADWAG WTC 600 Precision Balance |
| 339 | Rainin Dynamax RP-1 Peristaltic Pump |
| 340 | Rainin Pipetman Pipettes |
| 341 | Raman facility |
| 342 | RCA Wet Bench B102 |
| 343 | Reactive Ion Etcher 790 Nitride Left |
| 344 | Reactive Ion Etcher Unaxis 790 Middle |
| 345 | Reactive Ion Etcher Unaxis 790 Right |
| 346 | Reference 0:45 reflectometer |
| 347 | Reference Ballistic Chronograph |
| 348 | Reference Integrating Sphere for Spectral Reflectance |
| 349 | Reference transmittance densiometer |
| 350 | Reference Transmittance Spectrophotometer (RTS) |
| 351 | ResMap 178 |
| 352 | Revco Legaci ULT-2140-3-A36 Freezer |
| 353 | Revco REC5004A20 Chromatography Refrigerator |
| 354 | Reynolds RCA Wet Bench |
| 355 | Reynolds Tech Silicon Etch Wet Bench |
| 356 | Reynolds Tech Silicon Nitride Etch Wet Bench |
| 357 | Rigaku SmartLab X-Ray Diffraction |
| 358 | Rigaku Ultima III X-Ray Diffractometer |
| 359 | Robotic Optical Scattering Instrument (ROSI) |
| 360 | Robotics Test Facility |
| 361 | Roof Photovoltaic Test Facility |
| 362 | Rubber Process Analyzer |
| 363 | Sable Systems PTC-1 Cabinet and PELT-5 Controller |
| 364 | SAMCO RIE 10 NR |
| 365 | Sample Preparation and Metrology Tools |
| 366 | Sandvik Anneal Furnaces |
| 367 | Sandvik LPCVD Amorphous and Polycrystalline Silicon |
| 368 | Sandvik LPCVD LTO |
| 369 | Sandvik LPCVD Silicon Nitride |
| 370 | Sandvik Oxidation Furnaces |
| 371 | Sanyo Laboratory Freezer |
| 372 | Sartorius CP153 Top Loading Balance |
| 373 | Sartorius CP224S Analytical Balance |
| 374 | Sartorius CPA223S Balance |
| 375 | Sartorius CPA224S Balance |
| 376 | Sartorius Entris 224-1S Balance |
| 377 | Sartorius M-Power Precision Balance AZ124 |
| 378 | Sartorius Talent TE124S Balance |
| 379 | SAVANNAH S200-ALD |
| 380 | Semitool PSC-101 Spin Rinse Dryer |
| 381 | Sensofar Optical Profilometer |
| 382 | Si EUV Photodiode Transfer Standard |
| 383 | Silanization Oven |
| 384 | SIRCUS facility and uncertainties |
| 385 | Sloan Dektak II |
| 386 | Smart Manufacturing Systems (SMS) Test Bed |
| 387 | Soft X-ray Absorption and Emission Spectroscopy (µCAL) |
| 388 | Sonics VC-375 Ultrasonic Processor |
| 389 | South Bay Technology Low-Speed Saw |
| 390 | Specialty Coating Systems PDS 2010 Parylene Deposition System |
| 391 | Spectral comparator facilities |
| 392 | Spectrally tunable lighting facility |
| 393 | SPTS microEtch Hydrofluoric Acid Vapor Etcher |
| 394 | SPTS Omega c2L Rapier Deep Silicon Etcher |
| 395 | Sputter Deposition |
| 396 | SR865A Lock-In Amplifier |
| 397 | SSEC Single Wafer Cleaning System 1 |
| 398 | SSEC Single Wafer Cleaning System 2 |
| 399 | SSEC Single Wafer Cleaning System 3 |
| 400 | Standard Firebrand Generator |
| 401 | STS ICP Bosch Process |
| 402 | STS ICP HRM |
| 403 | STS ICP Multiplex |
| 404 | STS PECVD |
| 405 | Supreme Air H07 Fume Hood |
| 406 | Suss MicroTec ACS200 Automated Resist Coater |
| 407 | Suss MicroTec Delta12AQ Automated Resist Developer |
| 408 | Suss MicroTec MA/BA6 Gen4 Mask Aligner |
| 409 | Suss MicroTec SB6 Gen 2 Wafer Bonder |
| 410 | Synchrotron Ultraviolet Radiation Facility SURF III |
| 411 | Synchrotron X-ray Diffraction (XRD) |
| 412 | SyringeONE Programmable Syringe Pump |
| 413 | System for infrared spectral emittance of materials |
| 414 | T&T Nanosizer AUTO 1 Extruder |
| 415 | TA Degassing Station |
| 416 | Technics 2000 |
| 417 | Technics PE-IIA |
| 418 | Ted Pella easiGlow Glow Discharge Cleaning System |
| 419 | Tegal 901e |
| 420 | Tegal 903e |
| 421 | Telescope calibration facility (TCF) |
| 422 | Temescal BJD-1800 |
| 423 | Temescal BJD-1800 |
| 424 | Temescal FC-1800 |
| 425 | Temescal FC-1800 |
| 426 | Tencor Mgage-200 |
| 427 | Tencor Mgage-300 |
| 428 | Tencor Sonogage 200 |
| 429 | Terra Universal 100 Glovebox |
| 430 | TES FC-1800 |
| 431 | TESCAN MIRA3 for automated electron microscopy |
| 432 | The Divergent Beam Diffractometer Laboratory |
| 433 | The National Fire Research Laboratory |
| 434 | The Net-Zero Energy Residential Test Facility (NZERTF) |
| 435 | The Parallel Beam Diffractometer (PBD) Laboratory |
| 436 | The Silicon Crystal Lattice Comparator (Delta-d) Laboratory |
| 437 | Thermal Evaporation |
| 438 | Thermal Evaporation |
| 439 | Thermal Evaporation Solder |
| 440 | Thermal infrared transfer radiometer (TXR) |
| 441 | Thermal Thin-Al Evaporator |
| 442 | Thermo Forma ULT 8516 -86°C Freezer |
| 443 | Thermo Neslab EX7 Circulating Bath |
| 444 | Thermo Scientific 3556 Flammables Refrigerator |
| 445 | Thermo Scientific Evolution 201 UV-VIS Spectrometer |
| 446 | Thermo Scientific GPR Refrigerator |
| 447 | Thermo Scientific Lindberg Blue M Box Furnace |
| 448 | Thermo Scientific NESLAB RTE-7 Circulating Bath |
| 449 | Thermo Scientific Precision Model 658 Oven |
| 450 | Thermogravimetric Analyzer |
| 451 | Thermolyne 46100 High Temperature Chamber Furnace |
| 452 | Thermolyne 48000 Muffle Furnace |
| 453 | Thermolyne F21100 Tube Furnace |
| 454 | Time-resolved infrared spectroscopy (TRIR) |
| 455 | Toho Technology FLX-2320 Stress Measurement Tool |
| 456 | Tousimis Automegasamdri-916B Series C |
| 457 | Tousimis Autosamdri-815 Series B |
| 458 | Transfer spectrophotometer |
| 459 | Transient Gas Flow Facility |
| 460 | Tresky T-3000-FC3-HF Flip Chip Bonder |
| 461 | Ultrafast Terahertz Spectroscopy and Imaging |
| 462 | Ultraviolet Scale Realization Facility UV SRF |
| 463 | Unaxis Shuttleline DSEII Deep Silicon Etcher |
| 464 | Unaxis Shuttleline Inductively Coupled Plasma (ICP) Etcher |
| 465 | Unmanned Aerial Vehicles for Wildland-Urban Interface Fires |
| 466 | Vacuubrand PC101 Vacuum Pump |
| 467 | Vacuum Gauges |
| 468 | Varian 3120 E-Beam |
| 469 | Vector Potential Photoelectron Microscope (VPPEM) |
| 470 | Vigor GE Standard 1200 Glove Box |
| 471 | Virtual Cybernetic Building Testbed |
| 472 | VOC emissions chambers |
| 473 | VWR 75D Ultrasonic Cleaner |
| 474 | VWR Open Bath/Haake Temperature Control Module System |
| 475 | VWR Refrigerator |
| 476 | VWR Revco Technologies U2005GA14 Freezer |
| 477 | VWR Symphony 97043-936 Ultrasonic Cleaner |
| 478 | Wind Tunnel |
| 479 | X-ray Absorption Fine Structure (XAFS) |
| 480 | X-ray Backscatter Systems |
| 481 | X-Ray Diffractometer |
| 482 | X-ray Photoelectron Spectroscopy |
| 483 | X-Ray Reflectometer |
| 484 | X-Ray Residual Stress |
| 485 | Yamato 200C Vacuum Drying Oven |
| 486 | Yamato 300C Vacuum Oven |
| 487 | Yamato ADP21 Vacuum Drying Oven |
| 488 | Yamato ADP-31 Vacuum Oven |
| 489 | Yamato DKN402 Mechanical Convention Oven |
| 490 | YSI EcoSense pH 10 pH Meter |
| 491 | Zeiss Gemini 500 Field Emission Scanning Electron Microscope |
| 492 | Zeiss Gemini 560 Field Emission Scanning Electron Microscope |
| 493 | Zeiss Ultra 60 Field Emission Scanning Electron Microscope |
SS2877-20240524
