Description
Please contact us if you are interested in the following items. These items are only for end users and are subject to sale without notice. Appreciate your time.
- Alcatel 601E Deep Reactive Ion Etcher He Backside Cooling, Mechanical Clamp150mm
- Alcatel 601E Deep Reactive Ion Etcher Alcatel 601HPE Reactive Ion Etcher
- Oxford Plasmalab 100 ICP 200mm Platen, Load-Locked Single Chamber ICP, Chlorine Chemistry for Metal Etch Process200mm
- Oxford Plasmalab 100 RIE Oxford Plasmalab 100 RIE System200mm
- Oxford Plasmalab 133 ICP Load-Locked Single Chamber, 380mm electrode, Chlorine Chemistry!300mm
- Oxford Plasmalab 80 Plus ICP Single Chamber ICP, non-load locked, 200mm platen, All-New Oxford PLC controller installed with Windows 10.200mm
- Oxford Plasmalab 80 Plus PECVD Oxford Plasmalab 80 Plus PECVD System200mm
- Plasmatherm 790 RIE 200mm Wafer Max, Single RIE Chamber, Ideal for R&D!200mm
- Plasmatherm SLR-720 RIE Etcher 8″/200mm wafers max, single load-locked chamber200mm
- SPTS MPX ASE-HRM ICP PRO Etcher 200mm, Deep Silicon Etch (Bosch Process), High Rate Magnetic Chamber200mm
- SPTS MPX ICP SR Etcher Single Chamber, Load-Locked, 2007 Vintage200mm
- SPTS Primaxx Monarch 3 HF Etcher HF Vapor Etcher, currently 6″/150mm, capable of 200mm, Semi-Automatic 3-wafer loader with Load Lock.200mm
- Tepla 300 Plasma Asher 150mm wafers, Quartz Chamber, 2 Process Gas Inputs Plus N2 Input150mm
- Tepla 300 Plasma Asher 150mm wafers, Quartz Chamber, 2 Process Gas Inputs Plus N2 Input150mm
- Tepla 300 Plasma Asher 150mm wafers, Quartz Chamber, 2 Process Gas Inputs Plus N2 Input150mm
- Yield Engineering YES-III HMDS Oven Yield Engineering YES-III HMDS Vapor Prime Oven200mm
- KLA-Tencor ASET F5x 150/200/300mm Wafer Capable, Dual Beam Spectrometry, Spectroscopic Elipsometer300mm
- KLA-Tencor UV-1050 150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations200mm
- KLA-Tencor UV-1080 150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations200mm
- Nanometrics 6100 Capable of accommodating wafers from 75mm to 200mm200mm
- Nanometrics Nanospec 4000 Film Thickness Measurement System, 200mm Capable, Wafer Mapping Capability
- KLA-Tencor 5100 Overlay Registration System KLA-Tencor 5100 Overlay Registration System200mm
- KLA-Tencor 5200XP Overlay Registration System Fully Automated Non-Contact Box-In-Box Measurement for Overlay Registration (stepper alignment), 8″/200mm Wafer Capable System200mm
- KLA-Tencor P-22 (P22) Profiler Automated Surface Profilometer, Calibrated to OEM Specifications, 8″/200mm Wafers, Automated Handler 200mm
- KLA-Tencor Prometrix RS50 Four Point Probe, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots200mm
- KLA-Tencor Prometrix RS55/tc Four Point Probe, 200mm, Temp Compensation, Manual Wafer Handling, Contour Mapping, 3-D Plots200mm
- KLA-Tencor Prometrix RS55/tc Four Point Probe, 200mm, Temp Compensation, Manual Wafer Handling, Contour Mapping, 3-D Plots200mm
- KLA-Tencor Prometrix RS55/tca Four Point Probe, Temp Compensation, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots, Diameter Scans
- KLA-Tencor 2138XP 8″/200mm Wafers, Autofocus III, SECS II/GEM
- KLA-Tencor AIT I 6″/150mm & 8″/200mm Wafers, Auto Focus, Double Darkfield Inspection150mm
- KLA-Tencor AIT I Patterned Surface Defect Inspection System KLA-Tencor AIT I Patterned Surface Defect Inspection System
- KLA-Tencor Surfscan 4000 Unpatterned Wafer Surface Inspection Tool, up to 6”/150mm capable150mm
- KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection Tool, up to 6”/150mm Capable150mm
- KLA-Tencor Surfscan 5000 Unpatterned Wafer Surface Inspection Tool, Up to 8”/200mm Capable150mm
- KLA-Tencor Surfscan 6200 200mm Wafers, New Laser, Optics Aligned, New Power Supply, Calibrated to OEM Specs200mm
- KLA-Tencor Surfscan 6220 New Laser, New Power Supply, Calibrated to OEM Specifications, Up to 8″/200mm Wafer Capable200mm
- KLA-Tencor Surfscan 6220 New Laser, New Power Supply, Calibrated to OEM Specifications, Up to 8″/200mm Wafer Capable200mm
- KLA-Tencor Surfscan 6420 New Laser, New Power Supply, Calibrated to OEM Specifications, up to 8″/200mm Wafer Capable200mm
- Accent Bio-Rad Q5 Overlay Registration System200mm
- Accent Bio-Rad Q8 Overlay Metrology System, Setup for 8″/200mm Wafers, Fully Robotic200mm
- Hitachi S-9360 SEM Hitachi S-9360 SEM200mm
- JEOL JBX-6000FS/E SEM JEOL JBX-6000FS/E SEM150mm
- Plasmos SD-4000 Ellipsometer 8″/200mm Wafer Capable, Automated Ellipsometer, 3 Lasers200mm
- Seiko SMI3050 FIB-SEM FIB-SEM hybrid system equipped with an ion beam optical system and electron beam optical system200mm
- SPEA C320MX Semiconductor Tester SPEA C320-MX Semiconductor Tester w/ M310 Manipulator
- SPEA M300 Semiconductor Tester SPEA C320-MX Semiconductor Tester w/ M300 Manipulator
ss380classoneequip
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