Description
Please contact us if you are interested in the following Imaging Equipment . The Imaging Equipment are only for end users and are subject to prior sale without notice. Appreciate your time.
| Equip Code | Name | Type |
| 3 | 2010F (JEOL) | TEM |
| 9 | 3D Bio AFM | Probe |
| 33 | 6300 SEM | SEM |
| 48 | Aberration Corrected STEM | TEM |
| 64 | Advanced Coater | Sample Prep |
| 66 | AFM | Probe |
| 67 | AFM | Probe |
| 68 | AFM | Probe |
| 69 | AFM – DI3100 | Probe |
| 70 | AFM – Veeco Icon | Probe |
| 72 | AFM1 | Probe |
| 93 | Agilent Cary Eclipse Fluorescence Spectrophotometer | Optical |
| 97 | Agilent PicoPlus atomic force microscope | Probe |
| 135 | Amray Scanning Electron Microscope | SEM |
| 136 | AMSCOPE IN300TB Inverted Microscope | Optical |
| 148 | AP-XPS/AP-STM | Probe |
| 156 | ARM200F (JEOL) | TEM |
| 167 | Asylum MFP-3D atomic force microscope | Probe |
| 173 | Atom Probe Tomography | Other |
| 174 | Atomic Force Microscope | Other |
| 175 | Atomic Force Microscope | Probe |
| 176 | Atomic Force Microscope | Probe |
| 178 | Atomic Force Microscope | Other |
| 199 | Axio Imager Microscope | Optical |
| 200 | Axiophot Photomicroscope | Optical |
| 201 | Axioskope 2 MAT | Optical |
| 208 | Baltec Carbon Coater | Sample Prep |
| 229 | BIO AFM | Probe |
| 234 | Biological Atomic Force and Super Resolution Fluorescence Microscope | Optical |
| 236 | Bioscope Resolve | Probe |
| 253 | Bruker AFM Multimode | Probe |
| 258 | Bruker Dimension | Probe |
| 259 | Bruker Dimension 3000 AFM | Probe |
| 260 | Bruker Dimension Icon AFM | Probe |
| 261 | Bruker Dimension Icon AFM | Probe |
| 262 | Bruker Dimension Icon Atomic Force Microscope | Probe |
| 266 | Bruker Fastscan | Probe |
| 268 | Bruker ICON PT System | Probe |
| 271 | Bruker Multimode | Probe |
| 277 | BX-51 Fluorescence Microscope | Optical |
| 320 | CM200-FEG (Philips) | TEM |
| 334 | Confocal Microscope | Confocal |
| 335 | Confocal microscope | Confocal |
| 336 | Confocal Microscope | Confocal |
| 337 | Confocal Scanning Laser Microscopes, 1 upright, 1 inverted | Confocal |
| 338 | Confocal, FLIM & Multi-Photon Fluorescence Microscope | Confocal |
| 339 | Confocal/fluorescence Microscope | Confocal |
| 350 | Conventional STEM | TEM |
| 360 | Cressington 108A Carbon Coater | Sample Prep |
| 362 | Critical Point Drier | Sample Prep |
| 364 | Critical Point Dryer | Sample Prep |
| 373 | Cryo SEM | SEM |
| 374 | Cryo Ultramicrotome | Sample Prep |
| 375 | Cryo Ultramicrotome | Sample Prep |
| 376 | Cryoplunge | Sample Prep |
| 377 | CryoTEM (Tecnai) | TEM |
| 378 | Cs-TEM Aberration Corrected MC Zeiss 200-80 | TEM |
| 392 | Cypher AFM | Probe |
| 393 | Cypher AFM | Probe |
| 441 | Diener/Femto Plasma Cleaner | Sample Prep |
| 450 | Dimension 3100 SPM | Probe |
| 451 | Dimpler | Sample Prep |
| 452 | Dimpler Grinder | Sample Prep |
| 453 | Dimpler/Grinder | Sample Prep |
| 454 | Dimpling Grinder | Sample Prep |
| 455 | Disc Cutter | Sample Prep |
| 456 | Disc Cutter | Sample Prep |
| 464 | Discovery 1 | Optical |
| 465 | Discovery 2 | Optical |
| 466 | Discovery 3 | Optical |
| 484 | Dualbeam FIB/SEM | FIB |
| 487 | Dynamic Force AFM (Asylum) | Probe |
| 499 | e-beam/SEM: FEI Nova | SEM |
| 513 | Ecomet | Sample Prep |
| 524 | Electroluminescence | Other |
| 535 | Electron Microprobe | Other |
| 557 | Emitech Au/Pd and Ir sputter coater | Sample Prep |
| 560 | Environmental FIB/SEM (Quanta) | SEM |
| 561 | Environmental TEM | TEM |
| 562 | EnviroScope Atomic Force Microscope (ESCOPE) | Probe |
| 564 | Epifluorescence Optical Microscope | Optical |
| 566 | ESEM | SEM |
| 567 | ESEM | SEM |
| 593 | FEI Helios 600 NanoLab, Focused Ion Beam (FIB) | FIB |
| 594 | FEI Helios 660 | FIB |
| 595 | FEI Helios Nanolab | FIB |
| 596 | FEI Nova 600 | SEM |
| 597 | FEI Nova Nano450 | SEM |
| 598 | FEI Nova Nanolab 200 FIB/SEM | FIB |
| 599 | FEI Quanta 200 3D FIB/SEM | FIB |
| 600 | FEI Quanta 600 FEG Environmental SEM | SEM |
| 601 | FEI Quanta 650 FEG | SEM |
| 602 | FEI Quanta 650 FEG SEM with Nabity Pattern Generator | SEM |
| 603 | FEI Sirion | SEM |
| 604 | FEI Strata DB235 FIB | FIB |
| 605 | FEI Tecnai | TEM |
| 606 | FEI Tecnai | TEM |
| 607 | FEI Tecnai Arctica CryoTEM with Autoloader | TEM |
| 608 | FEI Tecnai Cryo-Bio 200kV FEG TEM | TEM |
| 609 | FEI Tecnai F30 TEM | TEM |
| 610 | FEI Tecnia Osiris | TEM |
| 611 | FEI Titan 300 | TEM |
| 613 | FESEM Supra 55VP | SEM |
| 614 | FESEM Ultra Plus | SEM |
| 615 | FESEM Ultra55 | SEM |
| 617 | FIB | FIB |
| 618 | FIB/SEM: FEI DB235 | FIB |
| 619 | FIB/SEM: FEI Helios 600i | FIB |
| 620 | Field Emission Scanning Electron Microscope | SEM |
| 621 | Field Emission Scanning Electron Microscope | SEM |
| 622 | Field Emission STEM | TEM |
| 653 | Focused Ion Beam & Scanning Electron Microscope | FIB |
| 654 | Focused Ion Beam – Nova 200 NanoLab (FEI) | FIB |
| 666 | Freeze Etching System | SEM |
| 693 | Gatan Precision Ion Mill | Sample Prep |
| 705 | Geochemistry AFM (Icon) | Probe |
| 709 | Glove Box | Sample Prep |
| 717 | Grinder/Polisher | Sample Prep |
| 747 | Helios Dual Beam FIB | SEM |
| 748 | Helios FIB/SEM | SEM |
| 749 | Helios Nanolab 660/G3 | FIB |
| 750 | Helium Ion Microscope | Other |
| 757 | Hi-Speed Camera | Other |
| 763 | HIROX KH-7700 3D Digital Video Microscope | Optical |
| 764 | HITACHI 4100 Spectrophotometer | Optical |
| 765 | Hitachi 4160 Scanning Electron Microscope | SEM |
| 766 | Hitachi FESEM | SEM |
| 767 | Hitachi H-8100 TEM | TEM |
| 768 | Hitachi HD-2300 STEM | TEM |
| 769 | Hitachi HD-2700 | TEM |
| 770 | Hitachi HT-7700 S/TEM | TEM |
| 771 | Hitachi HT7700 TEM | TEM |
| 772 | Hitachi S-3400 | SEM |
| 773 | Hitachi S-3500H SEM | SEM |
| 774 | Hitachi S-3700N VP-SEM | SEM |
| 775 | Hitachi S-4700 FE-SEM | SEM |
| 776 | Hitachi S-4800 | SEM |
| 777 | Hitachi S-4800 FESEM | SEM |
| 778 | Hitachi S-900 SEM – Rm 228 | SEM |
| 779 | Hitachi s4300 | SEM |
| 780 | Hitachi SU8010 SEM | SEM |
| 781 | Hitachi SU8030 | SEM |
| 782 | Hitachi SU8230 | SEM |
| 783 | Hitachi SU8230 | SEM |
| 788 | Horiba FluoroMax 4 | Optical |
| 803 | Hummer 5 Gold/Palladium Sputterer | Sample Prep |
| 804 | Hummer 6 Gold/Palladium Sputterer | Sample Prep |
| 806 | Hummer XP Gold Sputterer | Sample Prep |
| 809 | Hydrophilic Treatment System | Sample Prep |
| 818 | IBT | Sample Prep |
| 820 | Icon AFM | Other |
| 832 | Imaging Photoluminescence | Other |
| 833 | Imaging XPS | Other |
| 837 | Inspection microscope | Optical |
| 850 | Inverted Microscope | Optical |
| 855 | Ion Mill | Sample Prep |
| 857 | Ion Mill | Sample Prep |
| 859 | Ion Polisher | Sample Prep |
| 868 | Isomet | Sample Prep |
| 878 | JEOL 100 CX-II TEM | TEM |
| 879 | JEOL 2010 FED – TEM/STEM | TEM |
| 880 | Jeol 2010-F TEM | TEM |
| 881 | JEOL 2010F TEM/STEM | TEM |
| 882 | JEOL 2100 | TEM |
| 883 | JEOL 2100 HRTEM | TEM |
| 884 | JEOL 2100 TEM | TEM |
| 885 | JEOL 2100F S/TEM | TEM |
| 887 | JEOL 7500F HRSEM | SEM |
| 889 | JEOL ARM 200F STEM | TEM |
| 890 | JEOL Cross Section Polisher | Sample Prep |
| 894 | JEOL JEM2010 | TEM |
| 896 | JEOL Scanning Electron Microscope SEM | SEM |
| 897 | JEOL-SEM | SEM |
| 930 | Keyence microscope | Other |
| 931 | Keyence VHX-600 Digital Microscope | Optical |
| 932 | Keyence VHX1000 | Optical |
| 933 | Keysight 5600 LS AFM | Probe |
| 944 | Knife Maker | Sample Prep |
| 957 | Lakeshore probe station | Probe |
| 970 | Laser Microscope | Confocal |
| 971 | Laser Scanning Microscope | Optical |
| 979 | LEAP 4000X Si | Other |
| 982 | Leica EM ACE200 Sample Coater | Sample Prep |
| 983 | Leica Microtome | Sample Prep |
| 984 | Leitz ergolux | Optical |
| 985 | Leitz Ergolux Microscope | Optical |
| 987 | LEO (Zeiss) 1550 Field Emission SEM | SEM |
| 988 | Leo 1525 | SEM |
| 989 | LEO 1530 FE-SEM | SEM |
| 990 | LEO 1530 SEM | SEM |
| 1011 | Liquid He CryoTEM | TEM |
| 1014 | Lock-in Thermography | Other |
| 1019 | Low angle Ion Milling and Polishing System | Sample Prep |
| 1023 | Low Temperature UHV STM/AFM | Probe |
| 1024 | Low-speed Diamond Saw | Sample Prep |
| 1077 | Materials Microscope | Optical |
| 1100 | MICROCT1 | Other |
| 1107 | Microscope | Optical |
| 1108 | Microscope 1 | Optical |
| 1109 | Microscope 1 — Instructional Center | Optical |
| 1110 | Microscope 2 | Optical |
| 1111 | Microscope 2 — Instructional Center | Optical |
| 1112 | Microscope 3 | Optical |
| 1113 | Microscope 4 | Optical |
| 1114 | Microscope 4 – IR (infrared) | Optical |
| 1115 | Microscope M1 (Olympus MX61) | Optical |
| 1116 | Microscope M2 (Olympus MX61) | Optical |
| 1117 | Microscope M3 – Soft-lithography | Optical |
| 1118 | Microscope M4 | Optical |
| 1119 | Microscope M5 (Nikon L200) | Optical |
| 1120 | Microscope P1 | Optical |
| 1121 | Microscope P2 | Optical |
| 1122 | Microscope P3 | Optical |
| 1123 | Microscope P4 | Optical |
| 1124 | Microscope P5 | Optical |
| 1125 | Microscope Zeiss Axiotron | Optical |
| 1126 | Microscopes | Optical |
| 1127 | Microscopes | Optical |
| 1130 | Microtome RMC MR3 | Sample Prep |
| 1135 | Mid-Wave Thermal Imaging System | Other |
| 1142 | Minimet | Sample Prep |
| 1170 | MTOME1 | Sample Prep |
| 1172 | Multimode AFM (Nanoscope) | Probe |
| 1173 | Multiprep | Sample Prep |
| 1174 | MultiPrep Polisher | Sample Prep |
| 1175 | Multiprep Polishers | Sample Prep |
| 1176 | Multiprep Polishers | Sample Prep |
| 1177 | Multiprep Polishers | Sample Prep |
| 1185 | Nano Mill | Sample Prep |
| 1199 | NanoMill 1040 | Sample Prep |
| 1204 | Nanoscience TraxSTM | Probe |
| 1224 | Nikon Eclipse E-800 (2 units) | Optical |
| 1225 | Nikon Eclipse L200 Microscope (3) | Optical |
| 1226 | Nikon L200 Eclipse Microscope | Optical |
| 1229 | Nikon SMZ-1500 | Optical |
| 1230 | Nion UltraSTEM 100 | TEM |
| 1242 | Olympus Confocal Microscope | Confocal |
| 1243 | Olympus DSX-500 digital microscope | Optical |
| 1244 | Olympus Inspection Microscope | Optical |
| 1245 | Olympus Inspection Microscope | Optical |
| 1246 | Olympus Inspection Microscope | Optical |
| 1247 | Olympus Inspection Microscope | Optical |
| 1248 | Olympus LEXT 3D Material Confocal Microscope | Confocal |
| 1249 | Olympus MX-50 | Optical |
| 1250 | Olympus MX50 Microscope | Optical |
| 1251 | Olympus MX61 Microscope – Pettit | Optical |
| 1252 | Olympus polarizing Microscope | Optical |
| 1253 | Omicron VT-STM/AFM | Probe |
| 1259 | Optical Microscope | Optical |
| 1260 | Optical Microscope | Sample Prep |
| 1261 | Optical Microscopes – Other | Optical |
| 1269 | Osmium Coater | Sample Prep |
| 1270 | Oven | Sample Prep |
| 1301 | PALM – Laser Capture Microdissection | Other |
| 1343 | Phillips EM420 | TEM |
| 1351 | Photoemission Electron Microscope | Other |
| 1368 | PiFM | Probe |
| 1369 | PIPS | Sample Prep |
| 1374 | Plasma Cleaner | Sample Prep |
| 1375 | Plasma Cleaner | Sample Prep |
| 1377 | Plasma Cleaner | Sample Prep |
| 1379 | Plasma cleaner | Sample Prep |
| 1385 | Plasma Etcher | Sample Prep |
| 1415 | Polarized LM: Nikon LV100 | Optical |
| 1417 | Polisher | Sample Prep |
| 1418 | Polisher Grinder | Sample Prep |
| 1469 | Quanta 200 Environmental SEM | SEM |
| 1470 | Quanta 250 | SEM |
| 1471 | Quanta 600 FEG ESEM | SEM |
| 1481 | Quorum Q-150T ES | Sample Prep |
| 1483 | Radiological AFM | Probe |
| 1484 | Radiological FIB/SEM (Quanta) | SEM |
| 1486 | Radiological TEM (ARM) | TEM |
| 1487 | Radiological XPS | Other |
| 1584 | SC Fluids CPD110 | Sample Prep |
| 1589 | Scanning Electron Microscope | SEM |
| 1590 | Scanning electron Microscope | SEM |
| 1591 | Scanning electron Microscope | SEM |
| 1592 | Scanning Electron Microscope | SEM |
| 1593 | Scanning Electron Microscope with EDS | SEM |
| 1595 | Scanning Kelvin Probe: SKP5050 | Probe |
| 1596 | Scanning Probe AFM Compound Microscope | Probe |
| 1597 | Scanning Probe Microscope | Probe |
| 1598 | Scanning TEM | TEM |
| 1600 | Scattering IR SNOM | Other |
| 1602 | Schott IR Inspector | Optical |
| 1606 | SCOPE1 | Optical |
| 1607 | SCOPE3 | Optical |
| 1608 | SCOPE4 | Optical |
| 1609 | SCOPE7 | Optical |
| 1621 | SEM | SEM |
| 1622 | SEM | SEM |
| 1623 | SEM | SEM |
| 1624 | SEM/FIB with Zyvex S100 | SEM |
| 1625 | SEM/STEM | TEM |
| 1626 | SEM1 | SEM |
| 1627 | SEM2 | SEM |
| 1628 | SEM: FEI Magellan | SEM |
| 1629 | SEM: FEI Sirion | SEM |
| 1657 | SIM – Structured Illumination Super Resolution Fluorescence Microscope | Other |
| 1663 | Single-Molecule Fluorescence Microscope | Other |
| 1667 | Smart Zoom | Optical |
| 1685 | Sonoscan C-Mode Scanning Acoustic Microscope | Other |
| 1688 | Southbay PC2000 Plasma Cleaner | Sample Prep |
| 1696 | Spectroscopy: Horiba XploRA+ Confocal Raman | Confocal |
| 1713 | SPM: Horiba Labram Raman | Confocal |
| 1714 | SPM: Park NX-10 | Probe |
| 1715 | SPM: Park XE-100 | Probe |
| 1716 | SPM: Park XE-70 | Probe |
| 1717 | SPM: Scanning SQUID Microscope | Probe |
| 1718 | SPM: WITec Alpha 500 Raman | Confocal |
| 1729 | SPUT4 | Sample Prep |
| 1730 | Sputter Coater | Sample Prep |
| 1731 | Sputter coater | Sample Prep |
| 1732 | Sputter Coater | Sample Prep |
| 1750 | Stereo Microscope | Optical |
| 1751 | Stereoscope | Optical |
| 1753 | STM/AFM (PicoSPM) | Probe |
| 1755 | STORM/PALM – Super Resolution Fluorescence Microscope | Other |
| 1818 | Tecnai F20 (FEI) | TEM |
| 1819 | TECNAI TEM | TEM |
| 1821 | TEM 100CX | TEM |
| 1822 | TEM 2010F | TEM |
| 1823 | TEM Mill | Sample Prep |
| 1824 | TEM Mill | Sample Prep |
| 1825 | TEM2 | TEM |
| 1826 | TEM: FEI Tecnai | TEM |
| 1827 | TEM: FEI Titan | TEM |
| 1842 | TenuPol | Sample Prep |
| 1863 | Thermo Fisher Scientific Apreo SEM | SEM |
| 1864 | Thermo Fisher Scientific Quanta FEG 250 SEM | SEM |
| 1865 | Thermo Fisher Scios DualBeam FIB/SEM | FIB |
| 1866 | Thermo Fisher Scios DualBeam FIB/SEM | SEM |
| 1876 | Thermolyne Furnace | Sample Prep |
| 1892 | Titan 300/80 (FEI) | TEM |
| 1893 | Titan Krios (FEI) | TEM |
| 1906 | Transmission Electron Microscope | TEM |
| 1907 | Transmission Electron Microscope (TEM) | TEM |
| 1921 | Twin-jet Electro Polisher | Sample Prep |
| 1922 | Twin-jet Electro-polisher | Sample Prep |
| 1943 | UHV VT AFM | Probe |
| 1944 | Ultramicrotome | Sample Prep |
| 1945 | Ultramicrotome | Sample Prep |
| 1946 | Ultramicrotome | Sample Prep |
| 1949 | Ultrasonic Cutter | Sample Prep |
| 1950 | Ultrasonic Disc Cutter | Sample Prep |
| 1965 | UT FIB FEI | FIB |
| 1976 | Variable Pressure Scanning Electron Microscope | SEM |
| 1977 | Variable Temperature STM/AFM | Probe |
| 1978 | Variable Temperature UHV STM/AFM | Probe |
| 1982 | Veeco AFM | Probe |
| 1984 | Veeco BioScope II | Probe |
| 1988 | Veeco Mulitmode Atomic Force Microscope (AFM) | Probe |
| 1989 | Veeco NanoMan AFM | Probe |
| 1991 | Veeco Scanning Probe Microscope | Probe |
| 1993 | Vega 3 SEM | SEM |
| 2000 | Vibromet | Sample Prep |
| 2001 | Video Microscope | Optical |
| 2007 | VITRO1 | Sample Prep |
| 2068 | X-ray Imaging System | Other |
| 2079 | XCT: Zeiss Xradia 520 Versa X-ray CT | Other |
| 2085 | XL30 Environmental FEG | SEM |
| 2112 | Zeiss Auriga Crossbeam FIB-FESEM | FIB |
| 2113 | Zeiss Axio Imager Z2m | Optical |
| 2114 | Zeiss Axio Observer A1 | Optical |
| 2115 | Zeiss Axio Observer Spinning Disc Confocal Microscope | Confocal |
| 2116 | Zeiss EVO | SEM |
| 2117 | Zeiss EVO LS VP-SEM | SEM |
| 2118 | Zeiss EVO SEM | SEM |
| 2119 | Zeiss FE-SEM Neon40 | SEM |
| 2120 | Zeiss Flourescence Microscope | Optical |
| 2121 | Zeiss Libra 120 PLUS TEM | TEM |
| 2122 | Zeiss NVision 40 | FIB |
| 2123 | Zeiss Optical Microscope | Sample Prep |
| 2124 | Zeiss Orion Plus Helium Ion Microscope | Other |
| 2125 | Zeiss Sigma 500 | SEM |
| 2126 | Zeiss Supra SEM | SEM |
| 2127 | Zeiss Ultra SEM | SEM |
| 2128 | Zeiss Ultra60 FE-SEM | SEM |
| 2129 | Zeiss Zxiolmager M2M microscope | Optical |
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