Description
Please contact us if you are interested in the following Equipment and Parts. The Equipment and Parts are only for end users and are subject to prior sale without notice. Appreciate your time.
Item | Tool | Model | Maker |
1 | ALD | Polygon8200(Pulser3000) | ASM |
2 | Ashing equipment | TCA-7822S | TOK |
3 | Ashing equipment | TCA-7822 | TOK |
4 | Ashing equipment | TCA-7822 | TOK |
5 | Ashing equipment | TCA-7822 | TOK |
6 | Atmosphere Transfer robot unit | UTWF-5000/CS-7100/YC-1515 | ASYST |
7 | Bonder | FA1000 | ADWELDS |
8 | Braking device | DBM-602R | Daitron |
9 | Bump height measuring apparatus | SP-500BW | TORAY |
10 | Bump height measuring apparatus | SP-500BW300 | TORAY |
11 | CMP/Polishing | nTrepid 6EH | Strasbaugh |
12 | CMP/Polishing | MAT-BC15C | MAT |
13 | CNC Image measurement | VMR-3020 | NIKON |
14 | Coator | Mark7 | TEL |
15 | Coator | Mark8 | TEL |
16 | Coator | Mark8 | TEL |
17 | Coator | TKLCT7-M130 | TEL |
18 | Coator | Mark8 | TEL |
19 | Deposition equipment | SEC-22WAC | SHOWA SHINKU |
20 | Dry etching | MUC-21-098 | SPP |
21 | Lift off cleaning equipment | TWPS-064-TJ | TAKADA |
22 | Mask Akigner | MA-8 | Suss MicroTec |
23 | Mini stepper | NES1-h4 | NIKON |
24 | Mini stepper | NES1-h4 | NIKON |
25 | Non-contact three-dimensional measuring | NH-4N | Mitaka Kohki |
26 | Optical interference type film thickness measuring equipment | M6100UV | Nanometrics |
27 | Plasma CVD | PD-3800LT | SAMCO |
28 | PLATEN CONTROL/Y SCAN UNIT | XU-CM1900P/XU-CM1900C/XU-AVS1900 | YASKAWA |
29 | Precision Bond Alignerment | EVG620 | EVG |
30 | Prober | P12XL, 2sets | TEL |
31 | Scan profile monitor | SPM-30 | Tokyo Cathode |
32 | Scanner power supply | P0621N-H-JX | TREK |
33 | Spectroscopic ellipsometer | GES5e | Semilab |
34 | Sputter | Centura PVD | AMAT |
35 | Stylus stepmeter | P-40H | Toho |
36 | Transmission meter (spectrophotometer) | FE-12 | Otsuka |
37 | Vacuum Transfer robot unit | UTV-F2620W/CS-7100 | ASYST |
38 | Vertical diffusion furnace | DD-812V | Hitachi Kokusai |
39 | Visual inspection | WI-2000 | ICOS |
40 | Visual inspection equipment | VI-4302 | TOPCON |
41 | Wafer exposure apparatus | PA-150MAD | Seiwa Optical |
42 | Wafer particle inspection | WM-2500 | TOPCON |
43 | Wafer particle inspection | WM-1500 | TOPCON |
44 | Wafer particle inspection equipment | WM-2500 | TOPCON |
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All used equipment /parts trademarks belongs to the original equipment manufacturer. All rights reserved.