Description
Used Semiconductor Equipment Parts-Metrology
Valid: Subject to prior payment/sale without notice. This is only for end users. Appreciate your time!
The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.
| ID# | Equipment Description | OEM | Max Size |
| 1 | WM-7SR Surface Particle Inspection System | Takano | 200mm |
| 2 | WM-10 Surface Particle Inspection System | Takano | 300mm |
| 3 | WM10R Surface Particle Inspection System | Takano | 300mm |
| 4 | Vi-4307 M/C Patterned Wafer Visual Inspection System | Takano | 300mm |
| 5 | Vi-4207 R/C Patterned Wafer Visual Inspection System | Takano | 200mm |
| 6 | Vi-5301 M Patterned Wafer Visual Inspection System | Takano | 300mm |
| 7 | Altax 300ex Micro Bump Whole Surface Inspection System | Takano | 300mm |
| 8 | ASET-F5x | KLA-Tencor | 300mm |
| 9 | UV-1280SE | KLA-Tencor | 200mm |
| 10 | AIT I | KLA-Tencor | 150mm |
| 11 | AIT I | KLA-Tencor | 200mm |
| 12 | Archer AIM+ | KLA-Tencor | 200/300mm |
| 13 | Archer XT+ | KLA-Tencor | 200/300mm |
| 14 | Altair 8935 Patterned Wafer Inspection System | KLA-Tencor | Various |
| 15 | Altair 8920 Patterned Wafer Inspection System | KLA-Tencor | 200/300mm |
| 16 | Surfscan 6200 Particle Inspection Tool | KLA-Tencor | 200mm |
| 17 | Surfscan 6420 Particle Inspection Tool | KLA-Tencor | 200mm |
| 18 | Microsense UMA-C200-STR Thin Film Stress Measurement System | KLA / MicroSense | 200mm |
| 19 | AITCO CMT SR2000N 4 Pt Probe | AITCO | |
| 20 | AccuFiz Fizeau Laser Interferometer | 4D Technology | |
| 21 | Prometrix UV-1050 Thin Film Measurement System | KLA-Tencor | 200mm |
| 22 | Prometrix RS55/tc Four Point Probe Resistivity Mapping System | KLA-Tencor | 200mm |
| 23 | FLX-2320 | KLA-Tencor | 200mm |
| 24 | Alpha Step IQ | KLA-Tencor | |
| 25 | NT3300 Optical Profilometer | Veeco Wyko | 200mm |
| 26 | NSX-95 Inspection Tool | Rudolph | 200mm |
| 27 | NSX-105 Inspection Tool | Rudolph | 200mm |
| 28 | NSX-115 Inspection Too | Rudolph | 200mm |
| 29 | Microscope with Loader | Nikon | 200mm |
| 30 | L200N Microscope w/ TH200 Wafer Loader | Nikon | 200mm |
| 31 | Microscope with Loader | Nikon | 200mm |
| 32 | Nspec PS Defect Inspection System | Nanotronics | 200mm |
| 33 | XD7600NT X-Ray Inspection System | Nordson / Dage | |
| 34 | Surfscan 5500 | KLA-Tencor | 200mm |
| 35 | Alpha Step 200 | KLA-Tencor | |
| 36 | Alpha Step 200 | KLA-Tencor | |
| 37 | ResMap 273 Resistivity Mapping System | CDE | 300mm |
| 38 | P-1 Profiler (Parts tool only) | KLA-Tencor | 150mm |
| 39 | Dage 4000 Shear Test | Nordson Dage | 200mm |
| 40 | Dage 4000 Shear Test | Nordson Dage | 200mm |
| 41 | T-224X Post Tape Inspection | TT Vision | 200mm |
| 42 | PBFT856VS Pull Force Tester | General Products | 200mm |
| 43 | XRX-X4 X-Ray System | CMI |
SS0992-S-5-5
