Description
Please contact us if you are interested in the following Imaging Equipment . The Imaging Equipment are only for end users and are subject to prior sale without notice. Appreciate your time.
Equip Code | Name | Type |
3 | 2010F (JEOL) | TEM |
9 | 3D Bio AFM | Probe |
33 | 6300 SEM | SEM |
48 | Aberration Corrected STEM | TEM |
64 | Advanced Coater | Sample Prep |
66 | AFM | Probe |
67 | AFM | Probe |
68 | AFM | Probe |
69 | AFM – DI3100 | Probe |
70 | AFM – Veeco Icon | Probe |
72 | AFM1 | Probe |
93 | Agilent Cary Eclipse Fluorescence Spectrophotometer | Optical |
97 | Agilent PicoPlus atomic force microscope | Probe |
135 | Amray Scanning Electron Microscope | SEM |
136 | AMSCOPE IN300TB Inverted Microscope | Optical |
148 | AP-XPS/AP-STM | Probe |
156 | ARM200F (JEOL) | TEM |
167 | Asylum MFP-3D atomic force microscope | Probe |
173 | Atom Probe Tomography | Other |
174 | Atomic Force Microscope | Other |
175 | Atomic Force Microscope | Probe |
176 | Atomic Force Microscope | Probe |
178 | Atomic Force Microscope | Other |
199 | Axio Imager Microscope | Optical |
200 | Axiophot Photomicroscope | Optical |
201 | Axioskope 2 MAT | Optical |
208 | Baltec Carbon Coater | Sample Prep |
229 | BIO AFM | Probe |
234 | Biological Atomic Force and Super Resolution Fluorescence Microscope | Optical |
236 | Bioscope Resolve | Probe |
253 | Bruker AFM Multimode | Probe |
258 | Bruker Dimension | Probe |
259 | Bruker Dimension 3000 AFM | Probe |
260 | Bruker Dimension Icon AFM | Probe |
261 | Bruker Dimension Icon AFM | Probe |
262 | Bruker Dimension Icon Atomic Force Microscope | Probe |
266 | Bruker Fastscan | Probe |
268 | Bruker ICON PT System | Probe |
271 | Bruker Multimode | Probe |
277 | BX-51 Fluorescence Microscope | Optical |
320 | CM200-FEG (Philips) | TEM |
334 | Confocal Microscope | Confocal |
335 | Confocal microscope | Confocal |
336 | Confocal Microscope | Confocal |
337 | Confocal Scanning Laser Microscopes, 1 upright, 1 inverted | Confocal |
338 | Confocal, FLIM & Multi-Photon Fluorescence Microscope | Confocal |
339 | Confocal/fluorescence Microscope | Confocal |
350 | Conventional STEM | TEM |
360 | Cressington 108A Carbon Coater | Sample Prep |
362 | Critical Point Drier | Sample Prep |
364 | Critical Point Dryer | Sample Prep |
373 | Cryo SEM | SEM |
374 | Cryo Ultramicrotome | Sample Prep |
375 | Cryo Ultramicrotome | Sample Prep |
376 | Cryoplunge | Sample Prep |
377 | CryoTEM (Tecnai) | TEM |
378 | Cs-TEM Aberration Corrected MC Zeiss 200-80 | TEM |
392 | Cypher AFM | Probe |
393 | Cypher AFM | Probe |
441 | Diener/Femto Plasma Cleaner | Sample Prep |
450 | Dimension 3100 SPM | Probe |
451 | Dimpler | Sample Prep |
452 | Dimpler Grinder | Sample Prep |
453 | Dimpler/Grinder | Sample Prep |
454 | Dimpling Grinder | Sample Prep |
455 | Disc Cutter | Sample Prep |
456 | Disc Cutter | Sample Prep |
464 | Discovery 1 | Optical |
465 | Discovery 2 | Optical |
466 | Discovery 3 | Optical |
484 | Dualbeam FIB/SEM | FIB |
487 | Dynamic Force AFM (Asylum) | Probe |
499 | e-beam/SEM: FEI Nova | SEM |
513 | Ecomet | Sample Prep |
524 | Electroluminescence | Other |
535 | Electron Microprobe | Other |
557 | Emitech Au/Pd and Ir sputter coater | Sample Prep |
560 | Environmental FIB/SEM (Quanta) | SEM |
561 | Environmental TEM | TEM |
562 | EnviroScope Atomic Force Microscope (ESCOPE) | Probe |
564 | Epifluorescence Optical Microscope | Optical |
566 | ESEM | SEM |
567 | ESEM | SEM |
593 | FEI Helios 600 NanoLab, Focused Ion Beam (FIB) | FIB |
594 | FEI Helios 660 | FIB |
595 | FEI Helios Nanolab | FIB |
596 | FEI Nova 600 | SEM |
597 | FEI Nova Nano450 | SEM |
598 | FEI Nova Nanolab 200 FIB/SEM | FIB |
599 | FEI Quanta 200 3D FIB/SEM | FIB |
600 | FEI Quanta 600 FEG Environmental SEM | SEM |
601 | FEI Quanta 650 FEG | SEM |
602 | FEI Quanta 650 FEG SEM with Nabity Pattern Generator | SEM |
603 | FEI Sirion | SEM |
604 | FEI Strata DB235 FIB | FIB |
605 | FEI Tecnai | TEM |
606 | FEI Tecnai | TEM |
607 | FEI Tecnai Arctica CryoTEM with Autoloader | TEM |
608 | FEI Tecnai Cryo-Bio 200kV FEG TEM | TEM |
609 | FEI Tecnai F30 TEM | TEM |
610 | FEI Tecnia Osiris | TEM |
611 | FEI Titan 300 | TEM |
613 | FESEM Supra 55VP | SEM |
614 | FESEM Ultra Plus | SEM |
615 | FESEM Ultra55 | SEM |
617 | FIB | FIB |
618 | FIB/SEM: FEI DB235 | FIB |
619 | FIB/SEM: FEI Helios 600i | FIB |
620 | Field Emission Scanning Electron Microscope | SEM |
621 | Field Emission Scanning Electron Microscope | SEM |
622 | Field Emission STEM | TEM |
653 | Focused Ion Beam & Scanning Electron Microscope | FIB |
654 | Focused Ion Beam – Nova 200 NanoLab (FEI) | FIB |
666 | Freeze Etching System | SEM |
693 | Gatan Precision Ion Mill | Sample Prep |
705 | Geochemistry AFM (Icon) | Probe |
709 | Glove Box | Sample Prep |
717 | Grinder/Polisher | Sample Prep |
747 | Helios Dual Beam FIB | SEM |
748 | Helios FIB/SEM | SEM |
749 | Helios Nanolab 660/G3 | FIB |
750 | Helium Ion Microscope | Other |
757 | Hi-Speed Camera | Other |
763 | HIROX KH-7700 3D Digital Video Microscope | Optical |
764 | HITACHI 4100 Spectrophotometer | Optical |
765 | Hitachi 4160 Scanning Electron Microscope | SEM |
766 | Hitachi FESEM | SEM |
767 | Hitachi H-8100 TEM | TEM |
768 | Hitachi HD-2300 STEM | TEM |
769 | Hitachi HD-2700 | TEM |
770 | Hitachi HT-7700 S/TEM | TEM |
771 | Hitachi HT7700 TEM | TEM |
772 | Hitachi S-3400 | SEM |
773 | Hitachi S-3500H SEM | SEM |
774 | Hitachi S-3700N VP-SEM | SEM |
775 | Hitachi S-4700 FE-SEM | SEM |
776 | Hitachi S-4800 | SEM |
777 | Hitachi S-4800 FESEM | SEM |
778 | Hitachi S-900 SEM – Rm 228 | SEM |
779 | Hitachi s4300 | SEM |
780 | Hitachi SU8010 SEM | SEM |
781 | Hitachi SU8030 | SEM |
782 | Hitachi SU8230 | SEM |
783 | Hitachi SU8230 | SEM |
788 | Horiba FluoroMax 4 | Optical |
803 | Hummer 5 Gold/Palladium Sputterer | Sample Prep |
804 | Hummer 6 Gold/Palladium Sputterer | Sample Prep |
806 | Hummer XP Gold Sputterer | Sample Prep |
809 | Hydrophilic Treatment System | Sample Prep |
818 | IBT | Sample Prep |
820 | Icon AFM | Other |
832 | Imaging Photoluminescence | Other |
833 | Imaging XPS | Other |
837 | Inspection microscope | Optical |
850 | Inverted Microscope | Optical |
855 | Ion Mill | Sample Prep |
857 | Ion Mill | Sample Prep |
859 | Ion Polisher | Sample Prep |
868 | Isomet | Sample Prep |
878 | JEOL 100 CX-II TEM | TEM |
879 | JEOL 2010 FED – TEM/STEM | TEM |
880 | Jeol 2010-F TEM | TEM |
881 | JEOL 2010F TEM/STEM | TEM |
882 | JEOL 2100 | TEM |
883 | JEOL 2100 HRTEM | TEM |
884 | JEOL 2100 TEM | TEM |
885 | JEOL 2100F S/TEM | TEM |
887 | JEOL 7500F HRSEM | SEM |
889 | JEOL ARM 200F STEM | TEM |
890 | JEOL Cross Section Polisher | Sample Prep |
894 | JEOL JEM2010 | TEM |
896 | JEOL Scanning Electron Microscope SEM | SEM |
897 | JEOL-SEM | SEM |
930 | Keyence microscope | Other |
931 | Keyence VHX-600 Digital Microscope | Optical |
932 | Keyence VHX1000 | Optical |
933 | Keysight 5600 LS AFM | Probe |
944 | Knife Maker | Sample Prep |
957 | Lakeshore probe station | Probe |
970 | Laser Microscope | Confocal |
971 | Laser Scanning Microscope | Optical |
979 | LEAP 4000X Si | Other |
982 | Leica EM ACE200 Sample Coater | Sample Prep |
983 | Leica Microtome | Sample Prep |
984 | Leitz ergolux | Optical |
985 | Leitz Ergolux Microscope | Optical |
987 | LEO (Zeiss) 1550 Field Emission SEM | SEM |
988 | Leo 1525 | SEM |
989 | LEO 1530 FE-SEM | SEM |
990 | LEO 1530 SEM | SEM |
1011 | Liquid He CryoTEM | TEM |
1014 | Lock-in Thermography | Other |
1019 | Low angle Ion Milling and Polishing System | Sample Prep |
1023 | Low Temperature UHV STM/AFM | Probe |
1024 | Low-speed Diamond Saw | Sample Prep |
1077 | Materials Microscope | Optical |
1100 | MICROCT1 | Other |
1107 | Microscope | Optical |
1108 | Microscope 1 | Optical |
1109 | Microscope 1 — Instructional Center | Optical |
1110 | Microscope 2 | Optical |
1111 | Microscope 2 — Instructional Center | Optical |
1112 | Microscope 3 | Optical |
1113 | Microscope 4 | Optical |
1114 | Microscope 4 – IR (infrared) | Optical |
1115 | Microscope M1 (Olympus MX61) | Optical |
1116 | Microscope M2 (Olympus MX61) | Optical |
1117 | Microscope M3 – Soft-lithography | Optical |
1118 | Microscope M4 | Optical |
1119 | Microscope M5 (Nikon L200) | Optical |
1120 | Microscope P1 | Optical |
1121 | Microscope P2 | Optical |
1122 | Microscope P3 | Optical |
1123 | Microscope P4 | Optical |
1124 | Microscope P5 | Optical |
1125 | Microscope Zeiss Axiotron | Optical |
1126 | Microscopes | Optical |
1127 | Microscopes | Optical |
1130 | Microtome RMC MR3 | Sample Prep |
1135 | Mid-Wave Thermal Imaging System | Other |
1142 | Minimet | Sample Prep |
1170 | MTOME1 | Sample Prep |
1172 | Multimode AFM (Nanoscope) | Probe |
1173 | Multiprep | Sample Prep |
1174 | MultiPrep Polisher | Sample Prep |
1175 | Multiprep Polishers | Sample Prep |
1176 | Multiprep Polishers | Sample Prep |
1177 | Multiprep Polishers | Sample Prep |
1185 | Nano Mill | Sample Prep |
1199 | NanoMill 1040 | Sample Prep |
1204 | Nanoscience TraxSTM | Probe |
1224 | Nikon Eclipse E-800 (2 units) | Optical |
1225 | Nikon Eclipse L200 Microscope (3) | Optical |
1226 | Nikon L200 Eclipse Microscope | Optical |
1229 | Nikon SMZ-1500 | Optical |
1230 | Nion UltraSTEM 100 | TEM |
1242 | Olympus Confocal Microscope | Confocal |
1243 | Olympus DSX-500 digital microscope | Optical |
1244 | Olympus Inspection Microscope | Optical |
1245 | Olympus Inspection Microscope | Optical |
1246 | Olympus Inspection Microscope | Optical |
1247 | Olympus Inspection Microscope | Optical |
1248 | Olympus LEXT 3D Material Confocal Microscope | Confocal |
1249 | Olympus MX-50 | Optical |
1250 | Olympus MX50 Microscope | Optical |
1251 | Olympus MX61 Microscope – Pettit | Optical |
1252 | Olympus polarizing Microscope | Optical |
1253 | Omicron VT-STM/AFM | Probe |
1259 | Optical Microscope | Optical |
1260 | Optical Microscope | Sample Prep |
1261 | Optical Microscopes – Other | Optical |
1269 | Osmium Coater | Sample Prep |
1270 | Oven | Sample Prep |
1301 | PALM – Laser Capture Microdissection | Other |
1343 | Phillips EM420 | TEM |
1351 | Photoemission Electron Microscope | Other |
1368 | PiFM | Probe |
1369 | PIPS | Sample Prep |
1374 | Plasma Cleaner | Sample Prep |
1375 | Plasma Cleaner | Sample Prep |
1377 | Plasma Cleaner | Sample Prep |
1379 | Plasma cleaner | Sample Prep |
1385 | Plasma Etcher | Sample Prep |
1415 | Polarized LM: Nikon LV100 | Optical |
1417 | Polisher | Sample Prep |
1418 | Polisher Grinder | Sample Prep |
1469 | Quanta 200 Environmental SEM | SEM |
1470 | Quanta 250 | SEM |
1471 | Quanta 600 FEG ESEM | SEM |
1481 | Quorum Q-150T ES | Sample Prep |
1483 | Radiological AFM | Probe |
1484 | Radiological FIB/SEM (Quanta) | SEM |
1486 | Radiological TEM (ARM) | TEM |
1487 | Radiological XPS | Other |
1584 | SC Fluids CPD110 | Sample Prep |
1589 | Scanning Electron Microscope | SEM |
1590 | Scanning electron Microscope | SEM |
1591 | Scanning electron Microscope | SEM |
1592 | Scanning Electron Microscope | SEM |
1593 | Scanning Electron Microscope with EDS | SEM |
1595 | Scanning Kelvin Probe: SKP5050 | Probe |
1596 | Scanning Probe AFM Compound Microscope | Probe |
1597 | Scanning Probe Microscope | Probe |
1598 | Scanning TEM | TEM |
1600 | Scattering IR SNOM | Other |
1602 | Schott IR Inspector | Optical |
1606 | SCOPE1 | Optical |
1607 | SCOPE3 | Optical |
1608 | SCOPE4 | Optical |
1609 | SCOPE7 | Optical |
1621 | SEM | SEM |
1622 | SEM | SEM |
1623 | SEM | SEM |
1624 | SEM/FIB with Zyvex S100 | SEM |
1625 | SEM/STEM | TEM |
1626 | SEM1 | SEM |
1627 | SEM2 | SEM |
1628 | SEM: FEI Magellan | SEM |
1629 | SEM: FEI Sirion | SEM |
1657 | SIM – Structured Illumination Super Resolution Fluorescence Microscope | Other |
1663 | Single-Molecule Fluorescence Microscope | Other |
1667 | Smart Zoom | Optical |
1685 | Sonoscan C-Mode Scanning Acoustic Microscope | Other |
1688 | Southbay PC2000 Plasma Cleaner | Sample Prep |
1696 | Spectroscopy: Horiba XploRA+ Confocal Raman | Confocal |
1713 | SPM: Horiba Labram Raman | Confocal |
1714 | SPM: Park NX-10 | Probe |
1715 | SPM: Park XE-100 | Probe |
1716 | SPM: Park XE-70 | Probe |
1717 | SPM: Scanning SQUID Microscope | Probe |
1718 | SPM: WITec Alpha 500 Raman | Confocal |
1729 | SPUT4 | Sample Prep |
1730 | Sputter Coater | Sample Prep |
1731 | Sputter coater | Sample Prep |
1732 | Sputter Coater | Sample Prep |
1750 | Stereo Microscope | Optical |
1751 | Stereoscope | Optical |
1753 | STM/AFM (PicoSPM) | Probe |
1755 | STORM/PALM – Super Resolution Fluorescence Microscope | Other |
1818 | Tecnai F20 (FEI) | TEM |
1819 | TECNAI TEM | TEM |
1821 | TEM 100CX | TEM |
1822 | TEM 2010F | TEM |
1823 | TEM Mill | Sample Prep |
1824 | TEM Mill | Sample Prep |
1825 | TEM2 | TEM |
1826 | TEM: FEI Tecnai | TEM |
1827 | TEM: FEI Titan | TEM |
1842 | TenuPol | Sample Prep |
1863 | Thermo Fisher Scientific Apreo SEM | SEM |
1864 | Thermo Fisher Scientific Quanta FEG 250 SEM | SEM |
1865 | Thermo Fisher Scios DualBeam FIB/SEM | FIB |
1866 | Thermo Fisher Scios DualBeam FIB/SEM | SEM |
1876 | Thermolyne Furnace | Sample Prep |
1892 | Titan 300/80 (FEI) | TEM |
1893 | Titan Krios (FEI) | TEM |
1906 | Transmission Electron Microscope | TEM |
1907 | Transmission Electron Microscope (TEM) | TEM |
1921 | Twin-jet Electro Polisher | Sample Prep |
1922 | Twin-jet Electro-polisher | Sample Prep |
1943 | UHV VT AFM | Probe |
1944 | Ultramicrotome | Sample Prep |
1945 | Ultramicrotome | Sample Prep |
1946 | Ultramicrotome | Sample Prep |
1949 | Ultrasonic Cutter | Sample Prep |
1950 | Ultrasonic Disc Cutter | Sample Prep |
1965 | UT FIB FEI | FIB |
1976 | Variable Pressure Scanning Electron Microscope | SEM |
1977 | Variable Temperature STM/AFM | Probe |
1978 | Variable Temperature UHV STM/AFM | Probe |
1982 | Veeco AFM | Probe |
1984 | Veeco BioScope II | Probe |
1988 | Veeco Mulitmode Atomic Force Microscope (AFM) | Probe |
1989 | Veeco NanoMan AFM | Probe |
1991 | Veeco Scanning Probe Microscope | Probe |
1993 | Vega 3 SEM | SEM |
2000 | Vibromet | Sample Prep |
2001 | Video Microscope | Optical |
2007 | VITRO1 | Sample Prep |
2068 | X-ray Imaging System | Other |
2079 | XCT: Zeiss Xradia 520 Versa X-ray CT | Other |
2085 | XL30 Environmental FEG | SEM |
2112 | Zeiss Auriga Crossbeam FIB-FESEM | FIB |
2113 | Zeiss Axio Imager Z2m | Optical |
2114 | Zeiss Axio Observer A1 | Optical |
2115 | Zeiss Axio Observer Spinning Disc Confocal Microscope | Confocal |
2116 | Zeiss EVO | SEM |
2117 | Zeiss EVO LS VP-SEM | SEM |
2118 | Zeiss EVO SEM | SEM |
2119 | Zeiss FE-SEM Neon40 | SEM |
2120 | Zeiss Flourescence Microscope | Optical |
2121 | Zeiss Libra 120 PLUS TEM | TEM |
2122 | Zeiss NVision 40 | FIB |
2123 | Zeiss Optical Microscope | Sample Prep |
2124 | Zeiss Orion Plus Helium Ion Microscope | Other |
2125 | Zeiss Sigma 500 | SEM |
2126 | Zeiss Supra SEM | SEM |
2127 | Zeiss Ultra SEM | SEM |
2128 | Zeiss Ultra60 FE-SEM | SEM |
2129 | Zeiss Zxiolmager M2M microscope | Optical |
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