Description
Please contact us if you are interested in the Nanotechnology Equipment . The Nanotechnology Equipment is only for end users and are subject to prior sale without notice. Appreciate your time.
- Airco Temescal FC-1800 Evaporator
- Airco Temescal FC-1800 Evaporator
- Allied Diamond Saw
- Allied Multiprep
- Allied Techprep
- Allied Techprep 8
- AMAT AMP-3300 PECVD
- Atomic Force Microscope (AFM) Asylum MFP-3D classic Atomic Force Microscope (AFM)
- Confocal Laser Scanning Microscope — Keyence VKx1100
- CVC Products AST-601 Sputter
- Dektak 150 Stylus Profilometer
- Fischione 1050 Ion Mill
- Fischione SEM Ion Mill
- Focused Ion Beam & Scanning Electron Microscope – FEI Quanta 3D FEG
- Horiba XploRA PLUS Confocal Raman Microscope
- JEOL Carbon Coater
- Kurt J Lesker Dual Thermo Evaporator
- Leica UC7 Cryo Ultramicrotome
- MRC 603 MRC 693 TES-600 Sputter
- MRC 603 Sputter
- MRC 603 Sputter
- MRC 643 Sputter
- Nanoindentation Bruker Hysitron TI980 Triboindenter
- Nanoindentation Hysitron Ubi-1 Nanoindenter
- Perkin-Elmer 4400 Sputter
- Perkin-Elmer 4400 Sputter
- Plasma Therm 700 Plasma Etch&PECVD
- Plasmalab CVD-2
- Scanning Electron Microscopy (SEM) Cryo SEM – JEOL 7600F with Gatan Alto and Horiba CL Detector
- Scanning Electron Microscopy (SEM) Field Emission Scanning Electron Microscope – FEI Verios 460L
- Scanning Electron Microscopy (SEM) Variable Pressure Scanning Electron Microscope – Hitachi S3200N
- Temescal BJD-1800 Sputter
- Temescal FC-1800 Evaporator
- Temescal FC-1800 Evaporator
- Temescal FC-1800 Evaporation
- Time-of-Flight SIMS – ION-TOF SIMS 5
- Transmission Electron Microscopy Aberration Corrected STEM – FEI Titan 80-300
- Transmission Electron Microscopy Conventional STEM – JEOL 2000FX
- Transmission Electron Microscopy FEI Talos F200X
- Ultramicrotome – Leica UC7
- Varian 3118 E-Beam Thermal Evaporator
- XPS/UVS – SPECS System with PHOIBOS 150 Analyzer
- X-ray Diffraction Bruker AXS General Area Detector Diffraction System
- X-ray Diffraction PANalytical Empyrean – Linear Detector and Non-ambient Environment
- X-ray Diffraction Rigaku SmartLab X-Ray Diffractometer
- Zeiss Optical Microsocpe
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