Description
Please contact us if you are interested in the Asylum Research Cypher AFM . The Asylum Research Cypher AFM is only for end users and are subject to prior sale without notice. Appreciate your time.
The Asylum Research Cypher and Cypher ES offer significant improvements in speed, resolution, and performance. The system uses a 3rd generation NPSTM system to offer 60 pm positional control with industry leading low noise scanners (XY<60 pm and Z<50 pm) and detector with very high bandwidth (7 MHz).
Mode’s and Techniques:
* Contact: Uses feedback on deflection. Height, deflection, and lateral force (LFM) signals available.
* AC: Uses feedback on amplitude. Signals available include height, amplitude/phase, I/Q, deflection, lateral; digital Q-control included.
* Force: Force curve acquisition and mapping in contact or AC mode. Triggering/feedback allow for a wide variety of force curve modes.
* Dual AC: Provides multiple frequency drives and analyses for bimodal and harmonic measurements and imaging.
* Piezoresponse Force Microscopy (PFM): Enables high sensitivity, high bias and crosstalk free measurements of piezo materials.
* Electric Force Microscopy (EFM)
* Magnetic Force Microscopy (MFM)
* Surface Potential
* Nanolithography
* Nanomanipulation
* Frequency Modulation (FM)
* Operation in fluid
Optional
* Conductive AFM with ORCA Module: Provides low-current measurements at constant applied voltage for electrical characterization.
* Scanning Tunneling Microscopy (STM)
* blueDrive Photothermal Excitation
* Band Excitation for measurement of materials properties.
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