Semiconductor Equipment

Description

Please contact us if you are interested in the following  Semiconductor Equipment. The  Semiconductor Equipment are only for end users and are subject to prior sale without notice. Appreciate your time.

1. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
2. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
3. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
4. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
5. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
6. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
7. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
8. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
9. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
10. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
11. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
12. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
13. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
14. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
15. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
16. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
17. Axcelis Technologies Inc. RapidStrip 320 Stripper/Asher
18. BE Semiconductor Industries N.V. (BESI) Datacon 2200 APM Plus Die Bonder
19. BESI ESEC 2008 xP3 Die Bonder
20. BESI ESEC 2008 xP3 Die Bonder
21. BESI ESEC 2008 xP3 Die Bonder
22. BESI ESEC 2008 xP3 Die Bonder
23. BESI ESEC 2008 xP3 Die Bonder
24. Blue M Electric Company S05IEU55 Cure Oven
25. Blue M Electric Company STK Series Cure Oven
26. Blue M Electric Company STK Series Cure Oven
27. Blue M Electric Company STK Series Cure Oven
28. Blue M Electric Company STK Series Cure Oven
29. BTU International Paragon 98 IR reflow
30. CAMECA SC Ultra Total Magnetic Sector SIMS
31. Camtek Eagle-AP Bump Inspection
32. Canon FPA-6000 ES5 248nm (KrF) Scanner
33. Canon FPA-6000 ES5 248nm (KrF) Scanner
34. Canon FPA-6000 ES6a 248nm (KrF) Scanner
35. Canon FPA-6000 ES6 248nm (KrF) Scanner
36. Canon FPA-6000 ES6 248nm (KrF) Scanner
37. Canon FPA-6000 ES6a 248nm (KrF) Scanner
38. Canon FPA-6000 ES6 248nm (KrF) Scanner
39. Canon FPA-6000 ES6 248nm (KrF) Scanner
40. Canon FPA-6000 ES6 248nm (KrF) Scanner
41. Canon FPA-6000 ES6a 248nm (KrF) Scanner
42. Crown Simplimatic 8080 FIFO – LIFO Buffer
43. CSUN MFG. LTD. RIE Plasma Cleaner
44. Dainippon Screen Mfg. Co. FC-3000 Batch Wafer Processing
45. Dainippon Screen Mfg. Co. MP-3000 Single Wafer Processing
46. Delta Design Pyramid Pick & Place SOC Handler
47. Delta Design Pyramid Pick & Place SOC Handler
48. Delta Design Pyramid Pick & Place SOC Handler
49. Delta Design Pyramid Pick & Place SOC Handler
50. Delta Design Pyramid Pick & Place SOC Handler
51. Delta Design Pyramid Pick & Place SOC Handler
52. E.A. Fischione 1020 Plasma Cleaner
53. Ebara FREX300S Tungsten CMP
54. Ebara FREX300S Dielectric CMP
55. ECI Technology Qualilab QL-5EX Plating Bath Analysis
56. ECI Technology Qualilab QL-100EX Plating Bath Analysis
57. ECSAL Technologies Pte. Ltd. Hydrotek-03 Flux Cleaner
58. ECSAL Technologies Pte. Ltd. Hydrotek-03 Flux Cleaner
59. Entegris FOUP FOUP
60. Entegris FOUP FOUP
61. Entegris F300 – non-Cu FOUP
62. EO Technics WTM200 Laser Scribe
63. EO Technics Sunyang X2 Laser Scribe
64. ESCO Ltd. EMD-WA1000S Temperature Desorption Analyzer
65. ESEC SA 2008 HS3 Plus Die Bonder
66. ESEC SA 2008 HS3 Plus Die Bonder
67. ESEC SA 2008 HS3 Plus Die Bonder
68. Espec EGNU28-12CWL Environmental Chamber
69. Espec ESX-3CW Environmental Chamber
70. EV Group EVG150 Coat and Develop Track
71. FEI Company Strata 400S Focused Ion Beam (FIB)
72. FEI Company FIB 200 Focused Ion Beam (FIB)
73. FEI Company Helios NanoLab 1200HP Focused Ion Beam (FIB)
74. Felicity Technology (FSE) FSE-CS-300 Evaporator Deposition Equipment
75. First Ten Angstroms FTA3000 Life Sciences, Particle Analysis
76. Fortrend Engineering SIO-300-200-2 Bake Oven
77. Fortrend Engineering SIO-300-250-2 Bake Oven
78. Fries Research & Technology Microprof Profilometer
79. Fries Research & Technology MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System
80. GE Inspection Technologies Phoenix aminer X-ray Inspection
81. GE Inspection Technologies Phoenix aminer X-ray Inspection
82. Getech GSR1280E Mechanical
83. Getech GSR1200 Mechanical
84. Getech GSR1200 Mechanical
85. Heller Industries, Inc. 1826 Mark5 IR reflow
86. Heller Industries, Inc. 1826 Mark5 IR reflow
87. Hermes Microvision (HMI) eP3 XP E-beam Inspection
88. Hermes Microvision (HMI) eScan-315XP E-beam Inspection
89. Hitachi (Semiconductor) U-702 Metal Etch
90. Hitachi (Semiconductor) U-702 Metal Etch
91. Hitachi (Semiconductor) U-702 Metal Etch
92. Hitachi (Semiconductor) U-702 Metal Etch
93. Hitachi (Semiconductor) RS-6000 SEM – Defect Review (DR)
94. Hitachi (Semiconductor) U-7050A Metal Etch
95. Hitachi (Semiconductor) U-702 Metal Etch
96. Hitachi (Semiconductor) WA3300 Atomic Force Microscope (AFM)
97. Hitachi (Semiconductor) LS6800 Particle Measurement
98. Hitachi (Semiconductor) U-702 Metal Etch
99. Hitachi (Semiconductor) U-702 Metal Etch
100. Hitachi (Semiconductor) U-7050A Metal Etch
101. Hitachi (Semiconductor) U-7050A Metal Etch
102. Hitachi (Semiconductor) CM-700 Die Bonder
103. Hitachi (Semiconductor) CM-700 Die Bonder
104. Hitachi (Semiconductor) CM-700 Die Bonder
105. Hitachi (Semiconductor) CM-700 Die Bonder
106. Hitachi (Semiconductor) CM-700 Die Bonder
107. Hitachi (Semiconductor) CM-700 Die Bonder
108. Hitachi (Semiconductor) CM-700 Die Bonder
109. Hitachi Kokusai Electric Inc. Quixace II Vertical LPCVD Furnace
110. JEOL JWS-7555 SEM – Defect Review (DR)
111. JEOL JSM-6460LV FE SEM
112. Jordan Valley Semiconductors LTD JVX 6200 X-ray Fluorescence Spectrometer

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