Description
Please contact us for the availability of the used semiconductor equipment.The items are in Asia and are subject to prior sale without notice. The items are only for end users.
1 | AMAT | Etcher | CENTURA DPS ll MESA_T2 | Poly Etcher |
2 | AMAT | Etcher | CENTURA DPS ll MESA_T2 | Poly Etcher |
3 | AMAT | Etcher | CENTURA DPS ll MESA_T2 | Poly Etcher |
4 | AMAT | CVD | PRODUCER GT | |
5 | AMAT | CVD | PRODUCER SE (3-Twin) | HARP-USG CVD |
6 | AMAT | ETCH | DPS_G5_Mesa | POLY |
7 | AMAT | ETCHER | DPS II | AE Poly G3 |
8 | AMAT | ETCHER | DPS II | AE Poly G3 |
9 | BRUKER | MET | JVX6200 | |
10 | KLA | MET | PUMA 9000 | Defect Inspection |
11 | KORONA | IMP | AP-SYSTEM KORONA-1200P | METAL RTN |
12 | LAM | CVD | ALTUS | W |
13 | LAM | ETCH | FLEX_FX | ETCH |
14 | LAM | CVD | ALTUS | W |
15 | LAM | CVD | ALTUS | W |
16 | NANOMETRICS | MET | ATLAS | METRO |
17 | NOVELLUS | CVD | VECTOR_EXTREME | PECVD Nitride |
18 | NOVELLUS | CVD | VECTOR_EXPRESS | PECVD Nitride |
19 | NOVELLUS | CVD | VECTOR_EXPRESS | PECVD Nitride |
20 | PSK | ETCH | PSK TERA21 | ASHING |
21 | RUDOLPH | MET | AXI-S | DI Inspection |
22 | RUDOLPH | MET | S3000A | Tickness |
23 | RUDOLPH | MET | FE-7 | Focus Ellipsometer |
24 | RUDOLPH | MET | MP300 | Film thickness measurement |
25 | RUDOLPH | MET | MP300 | Film thickness measurement |
26 | TEL | FURNACE | FORMULA | ALD High-K |
27 | TEL | FURNACE | FORMULA | ALD High-K |
28 | TEL | FURNACE | FORMULA | ALD High-K |
SS5588