Used Semiconductor Equipment

 

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Description

Please contact us for the availability of the used semiconductor equipment for 8 inch wafer

NO Function IE   PU Vendor Model Inspection vintage
22 Cu Resistivity measurement system MUDRV61 KLA-TENCOR CRS-3100 X
42 MICRO MICRO-6 NIKON 0P-200C X
16 REVIEW ROL-A1 LEICA INS2000 X
17 DFSEM RSA-A1 KLA-TENCOR 3800C X
18 自動載入機 ISO-A2 LEICA INS10 X
19 光學顯微鏡 ISO-A2 LEICA INM20 X
20 光罩檢查機 RIK-A1 KLA-TENCOR KLA-301 X
43 MICRO MSL-A2 NIKON OST-V X
44 TRACK TRP-D1 DNS SD-80BWAVQ X
48 STRIP PSS-A4 PSC SA2000 X
50 DFSEM RSJ-A1 JEOL JWS-7555 X
15 BDFINP(Micro defect scanning system) ES20-1 KLA-TENCOR ES20A X
45 CDSEM CD-15 KLA ECD2 X
51 RECLAIM RECLAIM-1 SEMITOOL SPECTRUM X
1 WEE W9-7 USHIO PE-250R2 Y n/a
2 MASKINP API-3000 QC OPTICS API-3000/5 Y 1996
4 熱脫附分析儀 TDS-1 KAWASHO EMD-WA1000S Y 2000
5 DOSE DOSE-1 THERMA-WAVE TP-420 Y 1995
47 SOG SOG_B-4 DNS 80 Y 1997
49 REVIEW LEICA-3 LEICA INS-2000 Y N/A
52 FLAT ADE-1 KLA->ADE Ultratech 9600 Y N/A
53 FLAT ADE_B-1 KLA->ADE Ultratech 9600 Y N/A
24 晶粒取放機 ABPNP010 Besi / 均豪 DS-9000DATACON Y 2010
26 助熔劑清洗機 ABCLF010 SSEC 3302 Y 2010
27 電漿去渣機 ABDSC010 C-SUN RIE (2 FIXTURES) Y 2010
28 雷射刻印機 (Laser Marking) ABLMU010 EO CSM-2000U-UV->WTM-2000 Y 2010
29 二氧化碳混合機 ABSCO010 NMS “NDB-4,N4C-2.0-120NOMUR” Y 2005
31 電性測試機 AEWAT010 旺矽 LEDA-P6801 Y 2010
32 零件清洗機 ATCLP010 元峰 DUAL BATHS CLEANER (DI Y 2010
34 電鍍液檢控儀 ATMCV010 台灣港建 TKK QUALILAB-QL-5EX Y N/A
35 電鍍液檢控儀 ATMCV020 台灣港建 TKK QUALILAB-QL-100EX Y N/A
37 銅電鍍機 ATPLT010 美商辛拓 SEMITOOL RAIDER(2CU/1NI/1AU/2SR Y 2010
40 玻璃貼合機 AGATH010 MAP SB8ESUSS Y N/A

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