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Measurement Samples

NanoX-2000  3D surface topography for Semiconductor, MEM, LED,IC Packaging, Precision Surface, Solar Cell, Surface Roughness, Surface Coating etc.

  • MEMS Multi-layer structure
  • Sapphire wafer surface roughness analysis
  • Sapphire wafer polishing analysis via Roughness
  • Silicon wafer backgrinding surface roughness and defect analysis
  • Epi layer defect analysis
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Description

NanoX-2000 – Measurement Samples

NanoX-2000 Measurement Samples

NanoX-2000 – 3D、2D、1D display,data analysis:

NanoX-2000 Measurement Samples-1

NanoX-2000 – MEMS Multi-layer structure:

NanoX-2000- MEMS Multi-layer structure

NanoX-2000 – Sapphire wafer surface roughness analysis:

Sapphire wafer surface roughness analysis

NanoX-2000 – Sapphire wafer polishing analysis via Roughness:

Sapphire wafer polishing analysis via Roughness

NanoX-2000 – Silicon wafer backgrinding surface roughness and defect analysis:

Silicon wafer backgrinding surface roughness and defect analysis

NanoX-2000 – Epi layer defect analysis:

Epi layer defect analysis

  • Epi layer defect analysis;defect:PV~190nm,radius~2.0um:

Epi layer defect analysis;defect:PV~190nm,radius~2.0um

  • Epi defect analysis,zoom-in 3D view

Epi defect analysis,zoom-in 3D view

 

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