Description
Please contact us if you are interested in the following Resell-Metrology Equipment and Parts. The Equipment and Parts are only for end users and are subject to prior sale without notice. Appreciate your time.
| Item | Description |
| 13 | Rudolph Technologies, Inc. Matrix S-300 Ellipsometer,San Jose-SS5319 |
| 12 | Rudolph Technologies, Inc. Matrix S-300 Ellipsometer,San Jose-SS5319 |
| 11 | KLA-Tencor Corp. AIT XP Parts/Options,San Jose-SS5319 |
| 10 | Fries Research & Technology Microprof Profilometer,San Jose-SS5319 |
| 9 | Canon FPA-6000 ES6a 248nm (KrF) Scanner,San Jose-SS5319 |
| 8 | Applied Materials Endura 300 Aluminum Interconnect PVD (Physical Vapor Deposition),San Jose-SS5319 |
| 7 | Applied Materials SEMVision ADC Server SEM – Defect Review (DR),San Jose-SS5319 |
| 6 | 20 sets of Electroglas 2001X Wafer Probe -SS380 |
| 5 | ELECTROGLAS 4090u Prober,DOS OS, OCR, Chuck top: Nickel,PMI, RS232,GPIB, Inker, PTPO, APTPA, DPS, SS5487 |
| 4 | ELECTROGLAS 4090u Prober ,BPCC, DOS OS, OCR, Chuck top: Nickel,PMI, RS232,GPIB, Inker, PTPO, APTPA, DPS, SS5487 |
| 3 | Fries Research & Technology MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System -SS5319 |
| 2 | KLA / TENCOR eDR-5210 system, RS 4-Point probe capable, 8″-12″,EDX, Open cassette system, SS5487 |
| 1 | HITACHI S-9300 CD Scanning Electron Microscope (SEM),in USA, SS5487 |
