Description
Please contact us for the availability of the used semiconductor equipment.
| NO |
Maker |
Model |
Remark |
| 1 |
Advantest |
HSM 3600 |
|
| 2 |
Advantest |
T5585 |
|
| 3 |
Advantest |
T5592 |
|
| 4 |
Advantest |
DPS poly |
|
| 5 |
Advantest |
Emax CT+ |
|
| 6 |
AMAT |
Endura chamber 2sets |
|
| 7 |
Hitachi |
S9360 |
|
| 8 |
Hitachi |
S9380II |
|
| 9 |
Hitachi |
LS6800 |
|
| 10 |
Lam |
2300 |
no chamber |
| 11 |
Lam |
2300 |
|
| 12 |
Lam |
Kiyo-45 |
only chamber abd generator) |
| 13 |
Lam |
Flex45 |
only chamber abd generator) |
| 14 |
Lam |
Metal-M |
ony chamber |
| 15 |
Tel |
Telius SCCM |
|
| 16 |
Tel |
P12XLm |
|
| 17 |
Teradyne |
Magnum I |
|
| No |
Equipment Name |
Maker |
Model |
Size |
| 1 |
OXIDE ETCHER |
|
GEMINUS-6000 |
8inch |
| 2 |
CVD |
JEL |
TRUFIL PLUS |
8inch |
| 3 |
TRICENT2 |
AIXTRON INC. |
TICENT_AVD |
8inch |
| 4 |
Nitride-100 |
주식회사피에스티 |
MELITAS F30VD |
8inch |
| 5 |
WORKSTATION |
(주)그린벨시스템즈 |
SUN FIRE V440 |
8inch |
| 6 |
DATA SERVER |
(주)그린벨시스템즈 |
SUN FIRE X2100M2 |
8inch |
| 7 |
AUTO HANDLER |
MIRAE |
M420 |
8inch |
| 8 |
AUTO HANDLER |
MIRAE |
M420 |
8inch |
| 9 |
DEFLUX CLEANING |
FINE SONIC |
FSBW1000 |
8inch |
| 10 |
FURNACE |
ASM EUROPE B.V |
A412 |
8inch |
| 11 |
POLY ETCHER |
HITACHI HIGH-TECHNOLOGIES CORP |
POLY ETCHER |
8inch |
| 12 |
DARK FIELD |
HITACHI HIGH-TECHNOLOGIES CORP |
IS3000 |
8inch |
| 13 |
X-RAY SYSTEM |
PHOENIX X-RAY SYSTEMS & SERVIC |
NANOMX160 |
8inch |
| 14 |
SEM |
HITACHI HIGH-TECHNOLOGIES CORP |
S-4700 분석실(R2_3층) |
8inch |
| 15 |
Magnetic Sector SIMS |
CAMECA |
IMS-6F 624 |
8inch |
| 16 |
MEMORY TESTER |
ADVANTEST |
T5581H |
8inch |
| 17 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 18 |
MEMORY TESTER |
ADVANTEST |
T5581H |
8inch |
| 19 |
THICKNESS MEASUREMENT SYSTEM |
THERMA WAVE |
OP-2600 |
8inch |
| 20 |
PATTERNED WAFER INSPECTION |
KLA-TENCOR |
SFS-AIT |
8inch |
| 21 |
THIN FILM STRESS MEASUREMENT |
TEKTRONIX INC |
FLX-2320A |
8inch |
| 22 |
MICROSCOPE |
LEICA |
POLYVAR SC |
8inch |
| 23 |
MICROSCOPE |
LEICA |
INM20 |
8inch |
| 24 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 25 |
MICROSCOPE |
CARL ZEISS |
AXIOTRON-2 |
8inch |
| 26 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 27 |
MEMORY TESTER |
ADVANTEST |
T5581H |
8inch |
| 28 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 29 |
AUTO LOADER |
OLYMPUS CORPORATION |
AL100 |
8inch |
| 30 |
POLISHER / GRINDER |
TECHNOLOGY |
TA-12 |
8inch |
| 31 |
DIMPLE GRINDER |
GATAN, INC. |
GATAN 656 |
8inch |
| 32 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 33 |
ELLIPSOMETER |
RUDOLPH RESEARCH |
RUDOLPH/FE-7 |
8inch |
| 34 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 35 |
MEMORY TESTER |
ADVANTEST |
T5581P |
8inch |
| 36 |
MEMORY TESTER |
ADVANTEST CORPORATION |
T5581H |
8inch |
| 37 |
SECONDARY ION MASSSPECTROSCOPY |
Cameca |
IMS 6F |
8inch |
| 38 |
MEMORY TESTER |
ADVANTEST |
T5581H |
8inch |
| 39 |
WAFER SORTER |
WESTERN EQUIPMENT |
ROBA 2004L |
8inch |
| 40 |
HREM |
JEOL |
JEM-2010UHR |
8inch |
| 41 |
AUTO LOADER |
WETERN EQUIPMENT |
AL100-LMB8 |
8inch |
| 42 |
THICKNESS MEASUREMENT |
KLA TENCOR CORPORATION |
FX-200 |
8inch |
| 43 |
AUTO HANDLER |
MIRAE |
M420 |
8inch |
| 44 |
AUTO HANDLER |
TECHWING |
TW292 |
8inch |
| 45 |
WAFER INSPECTION SYSTEM |
NEGEVTECH LTD. |
NT-3100 |
8inch |
| 46 |
Single CVD |
AIXTRON INC. |
Lynx3 |
8inch |
| 47 |
PATTENRNED WAFER INSPECTION SYSTEM |
NEGEVTECH LTD. |
NT-3100 |
8inch |
| 48 |
PATTERNED WAFER INSPECTION SYSTEM |
KLA TENCOR CORPORATION |
KLA-2371 |
8inch |
| 49 |
MEMORY TESTER |
UNITEST |
UNI560 |
8inch |
| 50 |
AUTO HANDLER |
TECHWING |
TW282 |
8inch |
| 51 |
SORTER |
|
SPARTAN |
8inch |
| 52 |
AUTO HANDLER |
TECHWING |
TW282 |
8inch |
| 53 |
AUTO HANDLER |
TECHWING |
TW282 |
8inch |
| 54 |
LASER REPAIR |
ELECTRO SCIENTIFIC INDUSTRIES, |
M9830 |
8inch |
| 55 |
WAFER FLATNESS GAGE |
ADE CORPORATION |
WAFER SIGHT |
8inch |
| 56 |
PARTICLE COUNTER |
ADE CORPORATION |
FIT3120 |
8inch |
| 57 |
BRIGHT FIELD |
HYNIX SEMICONDUCTOR JAPAN INC. |
WINWIN50 1400 |
8inch |
| 58 |
PARTICLE COUNTER |
KLA_TENCOR |
FIT3120 |
8inch |
| 59 |
AUTO HANDLER |
TECHWING |
TW282 |
8inch |
| 60 |
MEMORY TESTER |
ADVANTEST CORP. |
T5581H |
8inch |
| 61 |
PATTERNED WAFER INSPECTION |
KLA TENCOR CORP |
KLA 2351 |
8inch |
| 62 |
THERMA PROBE |
THERMA WAVE |
TP-500 |
8inch |
| 63 |
SURFSCAN |
KLA TENCOR CORPORATION |
SP1TBI |
8inch |
| 64 |
THICKNESS MEASUREMENT SYSTEM |
THERMA WAVE |
OP-5240 |
8inch |
| 65 |
PM3 CHAMBER |
주성엔지니어링 |
CYCLONE+ |
8inch |
| 66 |
PVD(M2B)_DSTTN |
|
ENDURA2(±¸ : 201307-014) |
8inch |
| 67 |
TBMMB_C |
|
ENDURA2(±¸ : 201208-004) |
8inch |
| 68 |
RPC |
AXCELIS TECHNOLOGIES,LIMITED,K |
RAPID 320 FC |
8inch |
| 69 |
REFLOW MACHINE |
HELLER |
REFLOW MACHINE |
8inch |
| 70 |
AUTOLOADER |
OLYMPUS CORPORATION |
AL110-LMB12 |
8inch |
| 71 |
TUBE CLEANER |
에어프로덕츠한양기공(주) |
* |
8inch |
| 72 |
HIGH RESOLUTION X-RAY DIFFRACTOMETER |
PHILIPS ELECTRON OPTICS B.V. |
X-PERT MRD PRO |
8inch |
| 73 |
SCANNING ELECTRON MICROSCOPE |
HITACHI |
S-5000 |
8inch |
| 74 |
MICROSCOPE |
LEICA |
F7-SC-POLY |
8inch |
| 75 |
WAFER CARRIER & BOX CLEANING |
ATCOR |
MINIULTRA-1101 |
8inch |
| 76 |
STEREOSCOPE |
Nikon |
SMZ-1B |
8inch |
| 77 |
TUBE CLEANER |
DAN SCIENCE |
TUBE CLEAN |
8inch |
| 78 |
SCANNING PROBE MICROSCOPY |
BOC EDWARDS TECHNOLOGIES LIMIT |
SPI3800N |
8inch |
| 79 |
LOW POWER SCOPE |
NIKON CORPORATION |
SMZ645 |
8inch |
| 80 |
PROBE STATION |
CASCADE MICROTECH,INC. |
REL-6100 |
8inch |
| 81 |
LOW POWER SCOPE |
|
SZ61 |
8inch |
| 82 |
SORTER |
|
RASS300F |
8inch |
| 83 |
THERMOCHUCK SYSTEM |
|
TP0315A-TS-2 |
8inch |
| 84 |
LOW POWER SCOPE |
OLYMPUS CORPORATION |
SMZ645 |
8inch |
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