Description
NanoX-2000 – Measurement Samples
NanoX-2000 – 3D、2D、1D display，data analysis:
NanoX-2000 – MEMS Multi-layer structure:
NanoX-2000 – Sapphire wafer surface roughness analysis:
NanoX-2000 – Sapphire wafer polishing analysis via Roughness:
NanoX-2000 – Silicon wafer backgrinding surface roughness and defect analysis:
NanoX-2000 – Epi layer defect analysis:
- Epi layer defect analysis；defect：PV~190nm，radius～2.0um:
- Epi defect analysis，zoom-in 3D view
