Main Maker

JEOL JWS-7555

Description

Model: JEOL JWS-7555 SCANNING ELECTRON MICROSCOPE (SEM)

Location: USA.

Sales Type: Make offer / Bid

Sales Condition :AS IS/WHERE IS. No Warranty. No Refund.

Wafer Size: 8 inch

Vintage: 1998

Photos: Please contact us with the below form. Appreciate your time.

Detail info we can provide.

Wafer inspection SEM with X-ray detector
Resolution: 5nm
Magnification: 100x to 200,000x
Field emission electron gun
XY stage travel: 200mm.

This is still in the fab.  It is powered down.

The items are subject to prior sale without notice. These items are only for end users.

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