Description
Model: JEOL JWS-7555 SCANNING ELECTRON MICROSCOPE (SEM)
Location: USA.
Sales Type: Make offer / Bid
Sales Condition :AS IS/WHERE IS. No Warranty. No Refund.
Wafer Size: 8 inch
Vintage: 1998
Photos: Please contact us with the below form. Appreciate your time.
Detail info we can provide.
Wafer inspection SEM with X-ray detector
Resolution: 5nm
Magnification: 100x to 200,000x
Field emission electron gun
XY stage travel: 200mm.
This is still in the fab. It is powered down.
The items are subject to prior sale without notice. These items are only for end users.
SS5487